Towards better scanning near-field optical microscopy probes - progress and new developments
Heinzelmann H, Freyland JM, Eckert R, Huser T, Schurmann G, Noell W, Staufer U, De Rooij NF (1999)
Journal of Microscopy 194: 365-368.
Zeitschriftenaufsatz
| Veröffentlicht | Englisch
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Autor*in
Heinzelmann, H.;
Freyland, J. M.;
Eckert, R.;
Huser, ThomasUniBi 
;
Schurmann, G.;
Noell, W.;
Staufer, U.;
De Rooij, N. F.
;
Schurmann, G.;
Noell, W.;
Staufer, U.;
De Rooij, N. F.Einrichtung
Abstract / Bemerkung
Several approaches are described with the aim of producing near-field optical probes with improved properties. Focused ion beam milling allows the fabrication of small apertures in a controlled fashion, resulting in probes with excellent polarization properties and increased transmission. Microfabrication processes are described that allow the production of apertures of 30-50 nm, facilitating the mass-fabrication of apertured tip structures that can be used in a combined force/near-field optical microscope. Finally, possible future developments are outlined.
Stichworte
polarization contrast;
near-field optical probes;
microfabricated tips;
aperture formation;
focused ion beam milling
Erscheinungsjahr
1999
Zeitschriftentitel
Journal of Microscopy
Band
194
Seite(n)
365-368
ISSN
0022-2720
Page URI
https://pub.uni-bielefeld.de/record/2330821
Zitieren
Heinzelmann H, Freyland JM, Eckert R, et al. Towards better scanning near-field optical microscopy probes - progress and new developments. Journal of Microscopy. 1999;194:365-368.
Heinzelmann, H., Freyland, J. M., Eckert, R., Huser, T., Schurmann, G., Noell, W., Staufer, U., et al. (1999). Towards better scanning near-field optical microscopy probes - progress and new developments. Journal of Microscopy, 194, 365-368.
Heinzelmann, H., Freyland, J. M., Eckert, R., Huser, Thomas, Schurmann, G., Noell, W., Staufer, U., and De Rooij, N. F. 1999. “Towards better scanning near-field optical microscopy probes - progress and new developments”. Journal of Microscopy 194: 365-368.
Heinzelmann, H., Freyland, J. M., Eckert, R., Huser, T., Schurmann, G., Noell, W., Staufer, U., and De Rooij, N. F. (1999). Towards better scanning near-field optical microscopy probes - progress and new developments. Journal of Microscopy 194, 365-368.
Heinzelmann, H., et al., 1999. Towards better scanning near-field optical microscopy probes - progress and new developments. Journal of Microscopy, 194, p 365-368.
H. Heinzelmann, et al., “Towards better scanning near-field optical microscopy probes - progress and new developments”, Journal of Microscopy, vol. 194, 1999, pp. 365-368.
Heinzelmann, H., Freyland, J.M., Eckert, R., Huser, T., Schurmann, G., Noell, W., Staufer, U., De Rooij, N.F.: Towards better scanning near-field optical microscopy probes - progress and new developments. Journal of Microscopy. 194, 365-368 (1999).
Heinzelmann, H., Freyland, J. M., Eckert, R., Huser, Thomas, Schurmann, G., Noell, W., Staufer, U., and De Rooij, N. F. “Towards better scanning near-field optical microscopy probes - progress and new developments”. Journal of Microscopy 194 (1999): 365-368.
Daten bereitgestellt von European Bioinformatics Institute (EBI)
1 Zitation in Europe PMC
Daten bereitgestellt von Europe PubMed Central.
Survival rate of eukaryotic cells following electrophoretic nanoinjection.
Simonis M, Hübner W, Wilking A, Huser T, Hennig S., Sci Rep 7(), 2017
PMID: 28120926
Simonis M, Hübner W, Wilking A, Huser T, Hennig S., Sci Rep 7(), 2017
PMID: 28120926
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