Characterization of proton exchange layer profiles in KD2PO4 crystals by micro-Raman spectroscopy
Huser T, Hollars CW, Siekhaus WJ, De Yoreo JJ, Suratwala TI, Land TA (2004)
Applied Spectroscopy 58(3): 349-351.
Zeitschriftenaufsatz
| Veröffentlicht | Englisch
Download
Es wurden keine Dateien hochgeladen. Nur Publikationsnachweis!
Autor*in
Huser, ThomasUniBi 
;
Hollars, C. W.;
Siekhaus, W. J.;
De Yoreo, J. J.;
Suratwala, T. I.;
Land, T. A.
;
Hollars, C. W.;
Siekhaus, W. J.;
De Yoreo, J. J.;
Suratwala, T. I.;
Land, T. A.Einrichtung
Stichworte
deuterium depletion;
Raman spectroscopy;
DKDP crystals
Erscheinungsjahr
2004
Zeitschriftentitel
Applied Spectroscopy
Band
58
Ausgabe
3
Seite(n)
349-351
ISSN
0003-7028
Page URI
https://pub.uni-bielefeld.de/record/2330687
Zitieren
Huser T, Hollars CW, Siekhaus WJ, De Yoreo JJ, Suratwala TI, Land TA. Characterization of proton exchange layer profiles in KD2PO4 crystals by micro-Raman spectroscopy. Applied Spectroscopy. 2004;58(3):349-351.
Huser, T., Hollars, C. W., Siekhaus, W. J., De Yoreo, J. J., Suratwala, T. I., & Land, T. A. (2004). Characterization of proton exchange layer profiles in KD2PO4 crystals by micro-Raman spectroscopy. Applied Spectroscopy, 58(3), 349-351. https://doi.org/10.1366/000370204322886726
Huser, Thomas, Hollars, C. W., Siekhaus, W. J., De Yoreo, J. J., Suratwala, T. I., and Land, T. A. 2004. “Characterization of proton exchange layer profiles in KD2PO4 crystals by micro-Raman spectroscopy”. Applied Spectroscopy 58 (3): 349-351.
Huser, T., Hollars, C. W., Siekhaus, W. J., De Yoreo, J. J., Suratwala, T. I., and Land, T. A. (2004). Characterization of proton exchange layer profiles in KD2PO4 crystals by micro-Raman spectroscopy. Applied Spectroscopy 58, 349-351.
Huser, T., et al., 2004. Characterization of proton exchange layer profiles in KD2PO4 crystals by micro-Raman spectroscopy. Applied Spectroscopy, 58(3), p 349-351.
T. Huser, et al., “Characterization of proton exchange layer profiles in KD2PO4 crystals by micro-Raman spectroscopy”, Applied Spectroscopy, vol. 58, 2004, pp. 349-351.
Huser, T., Hollars, C.W., Siekhaus, W.J., De Yoreo, J.J., Suratwala, T.I., Land, T.A.: Characterization of proton exchange layer profiles in KD2PO4 crystals by micro-Raman spectroscopy. Applied Spectroscopy. 58, 349-351 (2004).
Huser, Thomas, Hollars, C. W., Siekhaus, W. J., De Yoreo, J. J., Suratwala, T. I., and Land, T. A. “Characterization of proton exchange layer profiles in KD2PO4 crystals by micro-Raman spectroscopy”. Applied Spectroscopy 58.3 (2004): 349-351.
Daten bereitgestellt von European Bioinformatics Institute (EBI)
Zitationen in Europe PMC
Daten bereitgestellt von Europe PubMed Central.
10 References
Daten bereitgestellt von Europe PubMed Central.
AUTHOR UNKNOWN, 0
Barker, Proc. SPIE-Int. Soc. Opt. Eng. 2633(), 1995
Popova, Sov. Phys. Solid State 12(), 1971
AUTHOR UNKNOWN, 0
AUTHOR UNKNOWN, 0
AUTHOR UNKNOWN, 0
AUTHOR UNKNOWN, 0
Yakshin, Laser Physics 7(), 1997
AUTHOR UNKNOWN, 0
AUTHOR UNKNOWN, 0
Export
Markieren/ Markierung löschen
Markierte Publikationen
Web of Science
Dieser Datensatz im Web of Science®Quellen
PMID: 15035718
PubMed | Europe PMC
Suchen in
Google Scholar