Characterization of proton exchange layer profiles in KD2PO4 crystals by micro-Raman spectroscopy
Huser T, Hollars CW, Siekhaus WJ, De Yoreo JJ, Suratwala TI, Land TA (2004)
Applied Spectroscopy 58(3): 349-351.
Zeitschriftenaufsatz
| Veröffentlicht | Englisch
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Autor*in
Huser, ThomasUniBi 
;
Hollars, C. W.;
Siekhaus, W. J.;
De Yoreo, J. J.;
Suratwala, T. I.;
Land, T. A.
;
Hollars, C. W.;
Siekhaus, W. J.;
De Yoreo, J. J.;
Suratwala, T. I.;
Land, T. A.Einrichtung
Stichworte
deuterium depletion;
Raman spectroscopy;
DKDP crystals
Erscheinungsjahr
2004
Zeitschriftentitel
Applied Spectroscopy
Band
58
Ausgabe
3
Seite(n)
349-351
ISSN
0003-7028
Page URI
https://pub.uni-bielefeld.de/record/2330687
Zitieren
Huser T, Hollars CW, Siekhaus WJ, De Yoreo JJ, Suratwala TI, Land TA. Characterization of proton exchange layer profiles in KD2PO4 crystals by micro-Raman spectroscopy. Applied Spectroscopy. 2004;58(3):349-351.
Huser, T., Hollars, C. W., Siekhaus, W. J., De Yoreo, J. J., Suratwala, T. I., & Land, T. A. (2004). Characterization of proton exchange layer profiles in KD2PO4 crystals by micro-Raman spectroscopy. Applied Spectroscopy, 58(3), 349-351. https://doi.org/10.1366/000370204322886726
Huser, Thomas, Hollars, C. W., Siekhaus, W. J., De Yoreo, J. J., Suratwala, T. I., and Land, T. A. 2004. “Characterization of proton exchange layer profiles in KD2PO4 crystals by micro-Raman spectroscopy”. Applied Spectroscopy 58 (3): 349-351.
Huser, T., Hollars, C. W., Siekhaus, W. J., De Yoreo, J. J., Suratwala, T. I., and Land, T. A. (2004). Characterization of proton exchange layer profiles in KD2PO4 crystals by micro-Raman spectroscopy. Applied Spectroscopy 58, 349-351.
Huser, T., et al., 2004. Characterization of proton exchange layer profiles in KD2PO4 crystals by micro-Raman spectroscopy. Applied Spectroscopy, 58(3), p 349-351.
T. Huser, et al., “Characterization of proton exchange layer profiles in KD2PO4 crystals by micro-Raman spectroscopy”, Applied Spectroscopy, vol. 58, 2004, pp. 349-351.
Huser, T., Hollars, C.W., Siekhaus, W.J., De Yoreo, J.J., Suratwala, T.I., Land, T.A.: Characterization of proton exchange layer profiles in KD2PO4 crystals by micro-Raman spectroscopy. Applied Spectroscopy. 58, 349-351 (2004).
Huser, Thomas, Hollars, C. W., Siekhaus, W. J., De Yoreo, J. J., Suratwala, T. I., and Land, T. A. “Characterization of proton exchange layer profiles in KD2PO4 crystals by micro-Raman spectroscopy”. Applied Spectroscopy 58.3 (2004): 349-351.
10 References
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