Metric adaptation for supervised attribute rating
Strickert M, Schleif F-M, Villmann T (2008)
In: Proceedings of the 16th European Symposium on Artificial Neural Networks (ESANN) 2008. Verleysen M (Ed); Evere, Belgium: d-side publications: 31-36.
Konferenzbeitrag
| Veröffentlicht | Englisch
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Autor*in
Strickert, M.;
Schleif, Frank-MichaelUniBi 
;
Villmann, T.
;
Villmann, T.Herausgeber*in
Verleysen, Michel
Einrichtung
Erscheinungsjahr
2008
Titel des Konferenzbandes
Proceedings of the 16th European Symposium on Artificial Neural Networks (ESANN) 2008
Seite(n)
31-36
Konferenz
ESANN 2008
Konferenzort
Bruges, Belgium
Konferenzdatum
2008-04-23/2008-04-25
ISBN
2-930307-08-0
Page URI
https://pub.uni-bielefeld.de/record/1992597
Zitieren
Strickert M, Schleif F-M, Villmann T. Metric adaptation for supervised attribute rating. In: Verleysen M, ed. Proceedings of the 16th European Symposium on Artificial Neural Networks (ESANN) 2008. Evere, Belgium: d-side publications; 2008: 31-36.
Strickert, M., Schleif, F. - M., & Villmann, T. (2008). Metric adaptation for supervised attribute rating. In M. Verleysen (Ed.), Proceedings of the 16th European Symposium on Artificial Neural Networks (ESANN) 2008 (pp. 31-36). Evere, Belgium: d-side publications.
Strickert, M., Schleif, Frank-Michael, and Villmann, T. 2008. “Metric adaptation for supervised attribute rating”. In Proceedings of the 16th European Symposium on Artificial Neural Networks (ESANN) 2008, ed. Michel Verleysen, 31-36. Evere, Belgium: d-side publications.
Strickert, M., Schleif, F. - M., and Villmann, T. (2008). “Metric adaptation for supervised attribute rating” in Proceedings of the 16th European Symposium on Artificial Neural Networks (ESANN) 2008, Verleysen, M. ed. (Evere, Belgium: d-side publications), 31-36.
Strickert, M., Schleif, F.-M., & Villmann, T., 2008. Metric adaptation for supervised attribute rating. In M. Verleysen, ed. Proceedings of the 16th European Symposium on Artificial Neural Networks (ESANN) 2008. Evere, Belgium: d-side publications, pp. 31-36.
M. Strickert, F.-M. Schleif, and T. Villmann, “Metric adaptation for supervised attribute rating”, Proceedings of the 16th European Symposium on Artificial Neural Networks (ESANN) 2008, M. Verleysen, ed., Evere, Belgium: d-side publications, 2008, pp.31-36.
Strickert, M., Schleif, F.-M., Villmann, T.: Metric adaptation for supervised attribute rating. In: Verleysen, M. (ed.) Proceedings of the 16th European Symposium on Artificial Neural Networks (ESANN) 2008. p. 31-36. d-side publications, Evere, Belgium (2008).
Strickert, M., Schleif, Frank-Michael, and Villmann, T. “Metric adaptation for supervised attribute rating”. Proceedings of the 16th European Symposium on Artificial Neural Networks (ESANN) 2008. Ed. Michel Verleysen. Evere, Belgium: d-side publications, 2008. 31-36.
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