Fabrication, thermal stability and reflectivity measurements of Mo/Si-multilayers as X-ray mirrors and other optical components
Kloidt A, Stock HJ, Kleineberg U, Döhring T, Pröpper M, Nolting K, Heidemann B, Tappe T, Schmiedeskamp B, Heinzmann U, Krumrey M, et al. (1992)
Spie Proc. 1992 (Soc. Phot. Opt. Instr. Eng.) 1742: 593.
Zeitschriftenaufsatz
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Autor*in
Kloidt, A.;
Stock, H.J.;
Kleineberg, U.;
Döhring, T.;
Pröpper, M.;
Nolting, K.;
Heidemann, B.;
Tappe, T.;
Schmiedeskamp, B.;
Heinzmann, UlrichUniBi;
Krumrey, M.;
Müller, P.
Alle
Alle
Erscheinungsjahr
1992
Zeitschriftentitel
Spie Proc. 1992 (Soc. Phot. Opt. Instr. Eng.)
Band
1742
Seite(n)
593
Page URI
https://pub.uni-bielefeld.de/record/1957942
Zitieren
Kloidt A, Stock HJ, Kleineberg U, et al. Fabrication, thermal stability and reflectivity measurements of Mo/Si-multilayers as X-ray mirrors and other optical components. Spie Proc. 1992 (Soc. Phot. Opt. Instr. Eng.). 1992;1742:593.
Kloidt, A., Stock, H. J., Kleineberg, U., Döhring, T., Pröpper, M., Nolting, K., Heidemann, B., et al. (1992). Fabrication, thermal stability and reflectivity measurements of Mo/Si-multilayers as X-ray mirrors and other optical components. Spie Proc. 1992 (Soc. Phot. Opt. Instr. Eng.), 1742, 593.
Kloidt, A., Stock, H.J., Kleineberg, U., Döhring, T., Pröpper, M., Nolting, K., Heidemann, B., et al. 1992. “Fabrication, thermal stability and reflectivity measurements of Mo/Si-multilayers as X-ray mirrors and other optical components”. Spie Proc. 1992 (Soc. Phot. Opt. Instr. Eng.) 1742: 593.
Kloidt, A., Stock, H. J., Kleineberg, U., Döhring, T., Pröpper, M., Nolting, K., Heidemann, B., Tappe, T., Schmiedeskamp, B., Heinzmann, U., et al. (1992). Fabrication, thermal stability and reflectivity measurements of Mo/Si-multilayers as X-ray mirrors and other optical components. Spie Proc. 1992 (Soc. Phot. Opt. Instr. Eng.) 1742, 593.
Kloidt, A., et al., 1992. Fabrication, thermal stability and reflectivity measurements of Mo/Si-multilayers as X-ray mirrors and other optical components. Spie Proc. 1992 (Soc. Phot. Opt. Instr. Eng.), 1742, p 593.
A. Kloidt, et al., “Fabrication, thermal stability and reflectivity measurements of Mo/Si-multilayers as X-ray mirrors and other optical components”, Spie Proc. 1992 (Soc. Phot. Opt. Instr. Eng.), vol. 1742, 1992, pp. 593.
Kloidt, A., Stock, H.J., Kleineberg, U., Döhring, T., Pröpper, M., Nolting, K., Heidemann, B., Tappe, T., Schmiedeskamp, B., Heinzmann, U., Krumrey, M., Müller, P., Scholze, F., Rahn, S., Hormes, J., Heidemann, K.F.: Fabrication, thermal stability and reflectivity measurements of Mo/Si-multilayers as X-ray mirrors and other optical components. Spie Proc. 1992 (Soc. Phot. Opt. Instr. Eng.). 1742, 593 (1992).
Kloidt, A., Stock, H.J., Kleineberg, U., Döhring, T., Pröpper, M., Nolting, K., Heidemann, B., Tappe, T., Schmiedeskamp, B., Heinzmann, Ulrich, Krumrey, M., Müller, P., Scholze, F., Rahn, S., Hormes, J., and Heidemann, K.F. “Fabrication, thermal stability and reflectivity measurements of Mo/Si-multilayers as X-ray mirrors and other optical components”. Spie Proc. 1992 (Soc. Phot. Opt. Instr. Eng.) 1742 (1992): 593.
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