Low energy electron point source microscopy: beyond imaging

Beyer, André; Gölzhäuser, Armin

Low energy electron point source microscopy: beyond imaging

Beyer A, Gölzhäuser A (2010)
J. of Physics: Condensed Matter 22(34): 343001.

Zeitschriftenaufsatz | Veröffentlicht | Englisch

Download

Es wurden keine Dateien hochgeladen. Nur Publikationsnachweis!

DOI

https://doi.org/10.1088/0953-8984/22/34/343001

Autor*in

Beyer, André^UniBi ; Gölzhäuser, Armin^UniBi

Einrichtung

Centrum für Biotechnologie > Arbeitsgruppe A. Gölzhäuser
Fakultät für Physik > AG Physik supramolekularer Systeme und Oberflächen
Centrum für Biotechnologie > Institut für Biophysik und Nanowissenschaften

Erscheinungsjahr

2010

Zeitschriftentitel

J. of Physics: Condensed Matter

Band

22

Ausgabe

34

Art.-Nr.

343001

ISSN

0953-8984

eISSN

1361-648X

Page URI

https://pub.uni-bielefeld.de/record/1904695

Zitieren

Beyer A, Gölzhäuser A. Low energy electron point source microscopy: beyond imaging. J. of Physics: Condensed Matter. 2010;22(34): 343001.

Beyer, A., & Gölzhäuser, A. (2010). Low energy electron point source microscopy: beyond imaging. J. of Physics: Condensed Matter, 22(34), 343001. https://doi.org/10.1088/0953-8984/22/34/343001

Beyer, André, and Gölzhäuser, Armin. 2010. “Low energy electron point source microscopy: beyond imaging”. J. of Physics: Condensed Matter 22 (34): 343001.

Beyer, A., and Gölzhäuser, A. (2010). Low energy electron point source microscopy: beyond imaging. J. of Physics: Condensed Matter 22:343001.

Beyer, A., & Gölzhäuser, A., 2010. Low energy electron point source microscopy: beyond imaging. J. of Physics: Condensed Matter, 22(34): 343001.

A. Beyer and A. Gölzhäuser, “Low energy electron point source microscopy: beyond imaging”, J. of Physics: Condensed Matter, vol. 22, 2010, : 343001.

Beyer, A., Gölzhäuser, A.: Low energy electron point source microscopy: beyond imaging. J. of Physics: Condensed Matter. 22, : 343001 (2010).

Beyer, André, and Gölzhäuser, Armin. “Low energy electron point source microscopy: beyond imaging”. J. of Physics: Condensed Matter 22.34 (2010): 343001.

Daten bereitgestellt von European Bioinformatics Institute (EBI)

3 Zitationen in Europe PMC

Daten bereitgestellt von Europe PubMed Central.

Spatial coherence of electron beams from field emitters and its effect on the resolution of imaged objects.
Latychevskaia T., Ultramicroscopy 175(), 2017
PMID: 28236742

Femtosecond electrons probing currents and atomic structure in nanomaterials.
Müller M, Paarmann A, Ernstorfer R., Nat Commun 5(), 2014
PMID: 25358554

Electron transparent graphene windows for environmental scanning electron microscopy in liquids and dense gases.
Stoll JD, Kolmakov A., Nanotechnology 23(50), 2012
PMID: 23165114

67 References

Daten bereitgestellt von Europe PubMed Central.

AUTHOR UNKNOWN, 0

Electron beam excitation and damage of biological molecules; its implications for specimen damage in electron microscopy.
Isaacson M, Johnson D, Crewe AV., Radiat. Res. 55(2), 1973
PMID: 4722685

AUTHOR UNKNOWN, 0

Optimization of the low energy electron point source microscope: imaging of macromolecules.
Golzhauser A, Volkel B, Grunze M, Kreuzer HJ., Micron 33(3), 2002
PMID: 11742748

AUTHOR UNKNOWN, 0

Boersch, Z. Techn. Phys. 12(), 1939

AUTHOR UNKNOWN, 0

Melmed, J Phys E 12(), 1979

AUTHOR UNKNOWN, 0

Fink, Phys Scr 38(), 1988

Holography with low-energy electrons.
Fink HW, Stocker W, Schmid H., Phys. Rev. Lett. 65(10), 1990
PMID: 10042201

Atomic resolution in lensless low-energy electron holography.
Fink HW, Schmid H, Kreuzer HJ, Wierzbicki A., Phys. Rev. Lett. 67(12), 1991
PMID: 10044182

AUTHOR UNKNOWN, 0

Silverman, Curr. Sci. 68(), 1995

AUTHOR UNKNOWN, 0

Völkl, Introduction to Electron Holography (), 1999

AUTHOR UNKNOWN, 0

Charge effect in point projection images of carbon fibres
Prigent M, Morin P., J Microsc 199 (Pt 3)(), 2000
PMID: 10971800

Electrical conduction through DNA molecules.
Fink HW, Schonenberger C., Nature 398(6726), 1999
PMID: 10201370

AUTHOR UNKNOWN, 0

Conducting, semiconducting and insulating objects observed by low-energy electron holography.
Bardon J, Degiovanni A, Georges V, Morin R., Ultramicroscopy 92(3-4), 2002
PMID: 12213014

AUTHOR UNKNOWN, 0

Spence, J. Electron Microscopy 45(), 1996

Reconstruction of composite in-line electron holograms using a small emission cone.
Holenstein R, Rothwell TA, Shegelski MR., Ultramicroscopy 94(2), 2003
PMID: 12505759

Resolving power of lens-less low energy electron point source microscopy.
Stevens GB., J Microsc 235(1), 2009
PMID: 19566623

Prigent, J Phys D Appl Phys 34(), 2001

Imaging charged objects using low-energy-electron coherent beams.
Georges V, Bardon J, Degiovanni A, Morin R., Ultramicroscopy 90(1), 2001
PMID: 11794627

Establishing Ohmic contacts for in situ current-voltage characteristic measurements on a carbon nanotube inside the scanning electron microscope.
Chen Q, Wang S, Peng LM., Nanotechnology 17(4), 2006
PMID: 21727386

AUTHOR UNKNOWN, 0