Low energy electron point source microscopy: beyond imaging

Beyer, André; Gölzhäuser, Armin

Low energy electron point source microscopy: beyond imaging

Beyer A, Gölzhäuser A (2010)
J. of Physics: Condensed Matter 22(34): 343001.

Zeitschriftenaufsatz | Veröffentlicht | Englisch

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DOI

https://doi.org/10.1088/0953-8984/22/34/343001

Autor*in

Beyer, André^UniBi ; Gölzhäuser, Armin^UniBi

Einrichtung

Centrum für Biotechnologie > Arbeitsgruppe A. Gölzhäuser
Fakultät für Physik > AG Physik supramolekularer Systeme und Oberflächen
Centrum für Biotechnologie > Institut für Biophysik und Nanowissenschaften

Erscheinungsjahr

2010

Zeitschriftentitel

J. of Physics: Condensed Matter

Band

22

Ausgabe

34

Art.-Nr.

343001

ISSN

0953-8984

eISSN

1361-648X

Page URI

https://pub.uni-bielefeld.de/record/1904695

Zitieren

Beyer A, Gölzhäuser A. Low energy electron point source microscopy: beyond imaging. J. of Physics: Condensed Matter. 2010;22(34): 343001.

Beyer, A., & Gölzhäuser, A. (2010). Low energy electron point source microscopy: beyond imaging. J. of Physics: Condensed Matter, 22(34), 343001. https://doi.org/10.1088/0953-8984/22/34/343001

Beyer, André, and Gölzhäuser, Armin. 2010. “Low energy electron point source microscopy: beyond imaging”. J. of Physics: Condensed Matter 22 (34): 343001.

Beyer, A., and Gölzhäuser, A. (2010). Low energy electron point source microscopy: beyond imaging. J. of Physics: Condensed Matter 22:343001.

Beyer, A., & Gölzhäuser, A., 2010. Low energy electron point source microscopy: beyond imaging. J. of Physics: Condensed Matter, 22(34): 343001.

A. Beyer and A. Gölzhäuser, “Low energy electron point source microscopy: beyond imaging”, J. of Physics: Condensed Matter, vol. 22, 2010, : 343001.

Beyer, A., Gölzhäuser, A.: Low energy electron point source microscopy: beyond imaging. J. of Physics: Condensed Matter. 22, : 343001 (2010).

Beyer, André, and Gölzhäuser, Armin. “Low energy electron point source microscopy: beyond imaging”. J. of Physics: Condensed Matter 22.34 (2010): 343001.

3 Zitationen in Europe PMC

Daten bereitgestellt von Europe PubMed Central.

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Latychevskaia T., Ultramicroscopy 175(), 2017
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Femtosecond electrons probing currents and atomic structure in nanomaterials.
Müller M, Paarmann A, Ernstorfer R., Nat Commun 5(), 2014
PMID: 25358554

Electron transparent graphene windows for environmental scanning electron microscopy in liquids and dense gases.
Stoll JD, Kolmakov A., Nanotechnology 23(50), 2012
PMID: 23165114

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