Low energy electron point source microscopy: beyond imaging

Beyer A, Gölzhäuser A (2010)
J. of Physics: Condensed Matter 22(34): 343001.

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Zeitschriftenaufsatz | Veröffentlicht | Englisch
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J. of Physics: Condensed Matter
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22
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34
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343001
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Beyer A, Gölzhäuser A. Low energy electron point source microscopy: beyond imaging. J. of Physics: Condensed Matter. 2010;22(34):343001.
Beyer, A., & Gölzhäuser, A. (2010). Low energy electron point source microscopy: beyond imaging. J. of Physics: Condensed Matter, 22(34), 343001. doi:10.1088/0953-8984/22/34/343001
Beyer, A., and Gölzhäuser, A. (2010). Low energy electron point source microscopy: beyond imaging. J. of Physics: Condensed Matter 22, 343001.
Beyer, A., & Gölzhäuser, A., 2010. Low energy electron point source microscopy: beyond imaging. J. of Physics: Condensed Matter, 22(34), p 343001.
A. Beyer and A. Gölzhäuser, “Low energy electron point source microscopy: beyond imaging”, J. of Physics: Condensed Matter, vol. 22, 2010, pp. 343001.
Beyer, A., Gölzhäuser, A.: Low energy electron point source microscopy: beyond imaging. J. of Physics: Condensed Matter. 22, 343001 (2010).
Beyer, André, and Gölzhäuser, Armin. “Low energy electron point source microscopy: beyond imaging”. J. of Physics: Condensed Matter 22.34 (2010): 343001.

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