Comparison of hard magnetic electrodes for magneto-electronics by magnetic force microscopy

Brückl H, Schmalhorst J-M, Boeve H, Gieres G, Wecker J (2002)
J. Appl. Phys. 91(10): 7029.

Zeitschriftenaufsatz | Veröffentlicht | Englisch
 
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Autor*in
Brückl, Hubert; Schmalhorst, Jan-MichaelUniBi ; Boeve, H.; Gieres, G.; Wecker, J.
Erscheinungsjahr
2002
Zeitschriftentitel
J. Appl. Phys.
Band
91
Ausgabe
10
Art.-Nr.
7029
ISSN
0021-8979
Page URI
https://pub.uni-bielefeld.de/record/1885662

Zitieren

Brückl H, Schmalhorst J-M, Boeve H, Gieres G, Wecker J. Comparison of hard magnetic electrodes for magneto-electronics by magnetic force microscopy. J. Appl. Phys. 2002;91(10): 7029.
Brückl, H., Schmalhorst, J. - M., Boeve, H., Gieres, G., & Wecker, J. (2002). Comparison of hard magnetic electrodes for magneto-electronics by magnetic force microscopy. J. Appl. Phys., 91(10), 7029. https://doi.org/10.1063/1.1447871
Brückl, Hubert, Schmalhorst, Jan-Michael, Boeve, H., Gieres, G., and Wecker, J. 2002. “Comparison of hard magnetic electrodes for magneto-electronics by magnetic force microscopy”. J. Appl. Phys. 91 (10): 7029.
Brückl, H., Schmalhorst, J. - M., Boeve, H., Gieres, G., and Wecker, J. (2002). Comparison of hard magnetic electrodes for magneto-electronics by magnetic force microscopy. J. Appl. Phys. 91:7029.
Brückl, H., et al., 2002. Comparison of hard magnetic electrodes for magneto-electronics by magnetic force microscopy. J. Appl. Phys., 91(10): 7029.
H. Brückl, et al., “Comparison of hard magnetic electrodes for magneto-electronics by magnetic force microscopy”, J. Appl. Phys., vol. 91, 2002, : 7029.
Brückl, H., Schmalhorst, J.-M., Boeve, H., Gieres, G., Wecker, J.: Comparison of hard magnetic electrodes for magneto-electronics by magnetic force microscopy. J. Appl. Phys. 91, : 7029 (2002).
Brückl, Hubert, Schmalhorst, Jan-Michael, Boeve, H., Gieres, G., and Wecker, J. “Comparison of hard magnetic electrodes for magneto-electronics by magnetic force microscopy”. J. Appl. Phys. 91.10 (2002): 7029.
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