Circular dichroism in the electron microscope: Progress and applications (invited)

Schattschneider P, Ennen I, Loeffler S, Stoeger-Pollach M, Verbeeck J (2010)
In: Journal of Applied Physics. JOURNAL OF APPLIED PHYSICS, 107(9). AMER INST PHYSICS.

Konferenzbeitrag | Veröffentlicht | Englisch
 
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Autor*in
Schattschneider, P.; Ennen, IngaUniBi; Loeffler, S.; Stoeger-Pollach, M.; Verbeeck, J.
Abstract / Bemerkung
According to theory, x-ray magnetic circular dichroism in a synchrotron is equivalent to energy loss magnetic chiral dichroism (EMCD) in a transmission electron microscope (TEM). After a synopsis of the development of EMCD, the theoretical background is reviewed and recent results are presented, focusing on the study of magnetic nanoparticles for ferrofluids and Heusler alloys for spintronic devices. Simulated maps of the dichroic strength as a function of atom position in the crystal allow evaluating the influence of specimen thickness and sample tilt on the experimental EMCD signal. Finally, the possibility of direct observation of chiral electronic transitions with atomic resolution in a TEM is discussed. (C) 2010 American Institute of Physics. [doi:10.1063/1.3365517]
Erscheinungsjahr
2010
Titel des Konferenzbandes
Journal of Applied Physics
Band
107
Ausgabe
9
Art.-Nr.
09D311
ISSN
0021-8979
Page URI
https://pub.uni-bielefeld.de/record/1795815

Zitieren

Schattschneider P, Ennen I, Loeffler S, Stoeger-Pollach M, Verbeeck J. Circular dichroism in the electron microscope: Progress and applications (invited). In: Journal of Applied Physics. JOURNAL OF APPLIED PHYSICS. Vol 107. AMER INST PHYSICS; 2010.
Schattschneider, P., Ennen, I., Loeffler, S., Stoeger-Pollach, M., & Verbeeck, J. (2010). Circular dichroism in the electron microscope: Progress and applications (invited). Journal of Applied Physics, JOURNAL OF APPLIED PHYSICS, 107 AMER INST PHYSICS. https://doi.org/10.1063/1.3365517
Schattschneider, P., Ennen, I., Loeffler, S., Stoeger-Pollach, M., and Verbeeck, J. (2010). “Circular dichroism in the electron microscope: Progress and applications (invited)” in Journal of Applied Physics JOURNAL OF APPLIED PHYSICS, vol. 107, (AMER INST PHYSICS).
Schattschneider, P., et al., 2010. Circular dichroism in the electron microscope: Progress and applications (invited). In Journal of Applied Physics. JOURNAL OF APPLIED PHYSICS. no.107 AMER INST PHYSICS.
P. Schattschneider, et al., “Circular dichroism in the electron microscope: Progress and applications (invited)”, Journal of Applied Physics, JOURNAL OF APPLIED PHYSICS, vol. 107, AMER INST PHYSICS, 2010.
Schattschneider, P., Ennen, I., Loeffler, S., Stoeger-Pollach, M., Verbeeck, J.: Circular dichroism in the electron microscope: Progress and applications (invited). Journal of Applied Physics. JOURNAL OF APPLIED PHYSICS. 107, AMER INST PHYSICS (2010).
Schattschneider, P., Ennen, Inga, Loeffler, S., Stoeger-Pollach, M., and Verbeeck, J. “Circular dichroism in the electron microscope: Progress and applications (invited)”. Journal of Applied Physics. AMER INST PHYSICS, 2010.Vol. 107. JOURNAL OF APPLIED PHYSICS.

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