The spin-orbit splitting in the Si bandstructure measured by means of spin-resolved photoemission
Schmiedeskamp B, Vogt B, Heinzmann U (1990)
Solid State Communications 76(12): 1391-1394.
Zeitschriftenaufsatz
| Veröffentlicht | Englisch
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Autor*in
Schmiedeskamp, B.;
Vogt, B.;
Heinzmann, UlrichUniBi
Erscheinungsjahr
1990
Zeitschriftentitel
Solid State Communications
Band
76
Ausgabe
12
Seite(n)
1391-1394
ISSN
0038-1098
Page URI
https://pub.uni-bielefeld.de/record/1780174
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Schmiedeskamp B, Vogt B, Heinzmann U. The spin-orbit splitting in the Si bandstructure measured by means of spin-resolved photoemission. Solid State Communications. 1990;76(12):1391-1394.
Schmiedeskamp, B., Vogt, B., & Heinzmann, U. (1990). The spin-orbit splitting in the Si bandstructure measured by means of spin-resolved photoemission. Solid State Communications, 76(12), 1391-1394. https://doi.org/10.1016/0038-1098(90)90393-P
Schmiedeskamp, B., Vogt, B., and Heinzmann, Ulrich. 1990. “The spin-orbit splitting in the Si bandstructure measured by means of spin-resolved photoemission”. Solid State Communications 76 (12): 1391-1394.
Schmiedeskamp, B., Vogt, B., and Heinzmann, U. (1990). The spin-orbit splitting in the Si bandstructure measured by means of spin-resolved photoemission. Solid State Communications 76, 1391-1394.
Schmiedeskamp, B., Vogt, B., & Heinzmann, U., 1990. The spin-orbit splitting in the Si bandstructure measured by means of spin-resolved photoemission. Solid State Communications, 76(12), p 1391-1394.
B. Schmiedeskamp, B. Vogt, and U. Heinzmann, “The spin-orbit splitting in the Si bandstructure measured by means of spin-resolved photoemission”, Solid State Communications, vol. 76, 1990, pp. 1391-1394.
Schmiedeskamp, B., Vogt, B., Heinzmann, U.: The spin-orbit splitting in the Si bandstructure measured by means of spin-resolved photoemission. Solid State Communications. 76, 1391-1394 (1990).
Schmiedeskamp, B., Vogt, B., and Heinzmann, Ulrich. “The spin-orbit splitting in the Si bandstructure measured by means of spin-resolved photoemission”. Solid State Communications 76.12 (1990): 1391-1394.
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