Exclusive Rho 0 and Phi production in deep inelastic muon scattering

Ashman J, Badelek B, Baum G, Beaufays J, Bee CP, Benchouk C, Bird IG, Brown SC, Caputo MC, Cheung HWK, Chima J, et al. (1988)
Z.Phys. C 39(2): 169-175.

Zeitschriftenaufsatz | Veröffentlicht | Englisch
 
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Erscheinungsjahr
1988
Zeitschriftentitel
Z.Phys. C
Band
39
Ausgabe
2
Seite(n)
169-175
ISSN
0170-9739
eISSN
1434-6052
Page URI
https://pub.uni-bielefeld.de/record/1776499

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Ashman J, Badelek B, Baum G, et al. Exclusive Rho 0 and Phi production in deep inelastic muon scattering. Z.Phys. C. 1988;39(2):169-175.
Ashman, J., Badelek, B., Baum, G., Beaufays, J., Bee, C. P., Benchouk, C., Bird, I. G., et al. (1988). Exclusive Rho 0 and Phi production in deep inelastic muon scattering. Z.Phys. C, 39(2), 169-175. doi:10.1007/BF01550991
Ashman, J., Badelek, B., Baum, G., Beaufays, J., Bee, C. P., Benchouk, C., Bird, I. G., Brown, S. C., Caputo, M. C., Cheung, H. W. K., et al. (1988). Exclusive Rho 0 and Phi production in deep inelastic muon scattering. Z.Phys. C 39, 169-175.
Ashman, J., et al., 1988. Exclusive Rho 0 and Phi production in deep inelastic muon scattering. Z.Phys. C, 39(2), p 169-175.
J. Ashman, et al., “Exclusive Rho 0 and Phi production in deep inelastic muon scattering”, Z.Phys. C, vol. 39, 1988, pp. 169-175.
Ashman, J., Badelek, B., Baum, G., Beaufays, J., Bee, C.P., Benchouk, C., Bird, I.G., Brown, S.C., Caputo, M.C., Cheung, H.W.K., Chima, J., Ciborowski, J., Clifft, R.W., Coignet, G., Combley, F., Court, G., Agostini, G. d, Drees, J., Düren, M., Dyce, N., Edwards, A.W., Edwards, M., Ernst, T., Ferrero, M.I., Foster, J., Francis, D., Gabathuler, E., Gajewski, J., Gamet, R., Geddes, N., Gibson, V., Gillies, J., Grafström, P., Hamacher, K., Harrach, D. von, Hayman, P., Heusch, C.A., Holt, J.R., Hughes, V.W., Jacholkowska, A., Janata, F., Jansco, G., Jones, T., Kabuss, E.M., Korzen, B., Krüner, U., Kullander, S., Landgraf, U., Lanske, D., Lettenström, F., Lindqvist, T., Loken, J., Matthews, M., Mizuno, Y., Mönig, K., Montanet, F., Nassalski, J., Nagy, E., Norton, P.R., Oakham, G., Oppenheim, R.F., Osborne, A.M., Papavassiliou, V., Pavel, N., Peroni, C., Peschel, H., Piegaia, R., Pietrzyk, B., Pietrzyk, U., Pönsgen, B., Povh, B., Renton, P., Ribarics, P., Rith, K., Rondio, E., Ropelewski, L., Salmon, D., Sandacz, A., Scheer, M., Schiemann, H., Schuler, K.P., Schultze, K., Shibata, T.-A., Sloan, T., Staiano, A., Stier, H.E., Stock, J., Studt, M., Taylor, G.N., Thompson, J.C., Toth, J., Wheeler, S., Urban, L., Walcher, T., Williams, W.S.C., Wimpenny, S.J., Windmolders, R., Womersley, W.J.: Exclusive Rho 0 and Phi production in deep inelastic muon scattering. Z.Phys. C. 39, 169-175 (1988).
Ashman, J., Badelek, B., Baum, Günter, Beaufays, J., Bee, C. P., Benchouk, C., Bird, I.G., Brown, S. C., Caputo, M. C., Cheung, H. W. K., Chima, J., Ciborowski, J., Clifft, R. W., Coignet, G., Combley, F., Court, G., Agostini, G. d, Drees, J., Düren, M., Dyce, N., Edwards, A. W., Edwards, M., Ernst, T., Ferrero, M. I., Foster, J., Francis, D., Gabathuler, E., Gajewski, J., Gamet, R., Geddes, N., Gibson, V., Gillies, J., Grafström, P., Hamacher, K., Harrach, D. von, Hayman, P., Heusch, C. A., Holt, J. R., Hughes, V. W., Jacholkowska, A., Janata, F., Jansco, G., Jones, T., Kabuss, E. M., Korzen, B., Krüner, U., Kullander, S., Landgraf, U., Lanske, D., Lettenström, F., Lindqvist, T., Loken, J., Matthews, M., Mizuno, Y., Mönig, K., Montanet, F., Nassalski, J., Nagy, E., Norton, P. R., Oakham, G., Oppenheim, R. F., Osborne, A. M., Papavassiliou, V., Pavel, N., Peroni, C., Peschel, H., Piegaia, R., Pietrzyk, B., Pietrzyk, U., Pönsgen, B., Povh, B., Renton, P., Ribarics, P., Rith, K., Rondio, E., Ropelewski, L., Salmon, D., Sandacz, A., Scheer, M., Schiemann, H., Schuler, K. P., Schultze, K., Shibata, T.-A., Sloan, T., Staiano, A., Stier, H. E., Stock, J., Studt, M., Taylor, G. N., Thompson, J. C., Toth, J., Wheeler, S., Urban, L., Walcher, T., Williams, W. S. C., Wimpenny, S. J., Windmolders, R., and Womersley, W. J. “Exclusive Rho 0 and Phi production in deep inelastic muon scattering”. Z.Phys. C 39.2 (1988): 169-175.
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