Application of a threshold electron spectrometer in spin resolved photoelectron analysis

Heckenkamp, Ch.; Schäfers, F.; Heinzmann, Ulrich; Frey, R.; Schlag, E. W.

Application of a threshold electron spectrometer in spin resolved photoelectron analysis

Heckenkamp C, Schäfers F, Heinzmann U, Frey R, Schlag EW (1983)
Nuclear Instruments and Methods in Physics Research 208(1-3): 805-808.

Zeitschriftenaufsatz | Veröffentlicht | Englisch

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Heinzmann_032.pdf

DOI

https://doi.org/10.1016/0167-5087(83)91224-3

URN

urn:nbn:de:0070-pub-17755036

Autor*in

Heckenkamp, Ch.; Schäfers, F.; Heinzmann, Ulrich^UniBi; Frey, R.; Schlag, E. W.

Einrichtung

Fakultät für Physik > Lehrstuhl für Molekül- und Oberflächenphysik

Abstract / Bemerkung

The paper shows that threshold photoelectron spectroscopy can be successfully performed, even if the spin polarization is the object of interest. Using circularly polarized radiation from the Bonn 2.5 GeV synchrotron photoelectrons from argon atoms produced directly at threshold have been analyzed with respect to their energy by means of a threshold electron spectrometer and with respect to their spin in order to test this combined method. The comparison of the experimental result with predictions of a RRPA-calculation shows quantitatively good agreement.

Erscheinungsjahr

1983

Zeitschriftentitel

Nuclear Instruments and Methods in Physics Research

Band

208

Ausgabe

1-3

Seite(n)

805-808

ISSN

0167-5087

Page URI

https://pub.uni-bielefeld.de/record/1775503

Zitieren

Heckenkamp C, Schäfers F, Heinzmann U, Frey R, Schlag EW. Application of a threshold electron spectrometer in spin resolved photoelectron analysis. Nuclear Instruments and Methods in Physics Research. 1983;208(1-3):805-808.

Heckenkamp, C., Schäfers, F., Heinzmann, U., Frey, R., & Schlag, E. W. (1983). Application of a threshold electron spectrometer in spin resolved photoelectron analysis. Nuclear Instruments and Methods in Physics Research, 208(1-3), 805-808. https://doi.org/10.1016/0167-5087(83)91224-3

Heckenkamp, Ch., Schäfers, F., Heinzmann, Ulrich, Frey, R., and Schlag, E. W. 1983. “Application of a threshold electron spectrometer in spin resolved photoelectron analysis”. Nuclear Instruments and Methods in Physics Research 208 (1-3): 805-808.

Heckenkamp, C., Schäfers, F., Heinzmann, U., Frey, R., and Schlag, E. W. (1983). Application of a threshold electron spectrometer in spin resolved photoelectron analysis. Nuclear Instruments and Methods in Physics Research 208, 805-808.

Heckenkamp, C., et al., 1983. Application of a threshold electron spectrometer in spin resolved photoelectron analysis. Nuclear Instruments and Methods in Physics Research, 208(1-3), p 805-808.

C. Heckenkamp, et al., “Application of a threshold electron spectrometer in spin resolved photoelectron analysis”, Nuclear Instruments and Methods in Physics Research, vol. 208, 1983, pp. 805-808.

Heckenkamp, C., Schäfers, F., Heinzmann, U., Frey, R., Schlag, E.W.: Application of a threshold electron spectrometer in spin resolved photoelectron analysis. Nuclear Instruments and Methods in Physics Research. 208, 805-808 (1983).

Heckenkamp, Ch., Schäfers, F., Heinzmann, Ulrich, Frey, R., and Schlag, E. W. “Application of a threshold electron spectrometer in spin resolved photoelectron analysis”. Nuclear Instruments and Methods in Physics Research 208.1-3 (1983): 805-808.

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