Determination of molecular orientation in ultrathin films ofaminophenylthiolate on Cu(100) prepared by vapour phase deposition
Gölzhäuser A, Panov S, Wöll C (1994)
Surface Science 314(1): L849-L856.
Zeitschriftenaufsatz
| Veröffentlicht | Englisch
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Autor*in
Gölzhäuser, ArminUniBi 
;
Panov, S.;
Wöll, Ch.
;
Panov, S.;
Wöll, Ch.Abstract / Bemerkung
Ultrathin layers of aminophenylthiol on Cu(100) were prepared by vapour phase deposition of 4,4'-diaminodiphenyldisulphide (DAPS). Composition and molecular orientation in the films were determined by X-ray photoelectron spectroscopy (XPS) and near edge X-ray absorption fine structure (NEXAFS) spectroscopy. DAPS molecules adsorb on Cu(100) by dissociation of the intramolecular S-S bond and the formation of aminophenylthiolate at the copper surface. NEXAFS spectra indicate the presence of well-ordered monolayers with the plane of the phenyl ring tilted by 24° with respect to the surface normal. The same tilt-angle is found in the submonolayer regime.
Erscheinungsjahr
1994
Zeitschriftentitel
Surface Science
Band
314
Ausgabe
1
Seite(n)
L849-L856
ISSN
0039-6028
Page URI
https://pub.uni-bielefeld.de/record/1775479
Zitieren
Gölzhäuser A, Panov S, Wöll C. Determination of molecular orientation in ultrathin films ofaminophenylthiolate on Cu(100) prepared by vapour phase deposition. Surface Science. 1994;314(1):L849-L856.
Gölzhäuser, A., Panov, S., & Wöll, C. (1994). Determination of molecular orientation in ultrathin films ofaminophenylthiolate on Cu(100) prepared by vapour phase deposition. Surface Science, 314(1), L849-L856. https://doi.org/10.1016/0039-6028(94)90206-2
Gölzhäuser, Armin, Panov, S., and Wöll, Ch. 1994. “Determination of molecular orientation in ultrathin films ofaminophenylthiolate on Cu(100) prepared by vapour phase deposition”. Surface Science 314 (1): L849-L856.
Gölzhäuser, A., Panov, S., and Wöll, C. (1994). Determination of molecular orientation in ultrathin films ofaminophenylthiolate on Cu(100) prepared by vapour phase deposition. Surface Science 314, L849-L856.
Gölzhäuser, A., Panov, S., & Wöll, C., 1994. Determination of molecular orientation in ultrathin films ofaminophenylthiolate on Cu(100) prepared by vapour phase deposition. Surface Science, 314(1), p L849-L856.
A. Gölzhäuser, S. Panov, and C. Wöll, “Determination of molecular orientation in ultrathin films ofaminophenylthiolate on Cu(100) prepared by vapour phase deposition”, Surface Science, vol. 314, 1994, pp. L849-L856.
Gölzhäuser, A., Panov, S., Wöll, C.: Determination of molecular orientation in ultrathin films ofaminophenylthiolate on Cu(100) prepared by vapour phase deposition. Surface Science. 314, L849-L856 (1994).
Gölzhäuser, Armin, Panov, S., and Wöll, Ch. “Determination of molecular orientation in ultrathin films ofaminophenylthiolate on Cu(100) prepared by vapour phase deposition”. Surface Science 314.1 (1994): L849-L856.
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