Determination of molecular orientation in ultrathin films ofaminophenylthiolate on Cu(100) prepared by vapour phase deposition

Gölzhäuser A, Panov S, Wöll C (1994)
Surface Science 314(1): L849-L856.

Zeitschriftenaufsatz | Veröffentlicht | Englisch
 
Download
OA
Autor*in
Gölzhäuser, ArminUniBi ; Panov, S.; Wöll, Ch.
Abstract / Bemerkung
Ultrathin layers of aminophenylthiol on Cu(100) were prepared by vapour phase deposition of 4,4'-diaminodiphenyldisulphide (DAPS). Composition and molecular orientation in the films were determined by X-ray photoelectron spectroscopy (XPS) and near edge X-ray absorption fine structure (NEXAFS) spectroscopy. DAPS molecules adsorb on Cu(100) by dissociation of the intramolecular S-S bond and the formation of aminophenylthiolate at the copper surface. NEXAFS spectra indicate the presence of well-ordered monolayers with the plane of the phenyl ring tilted by 24° with respect to the surface normal. The same tilt-angle is found in the submonolayer regime.
Erscheinungsjahr
1994
Zeitschriftentitel
Surface Science
Band
314
Ausgabe
1
Seite(n)
L849-L856
ISSN
0039-6028
Page URI
https://pub.uni-bielefeld.de/record/1775479

Zitieren

Gölzhäuser A, Panov S, Wöll C. Determination of molecular orientation in ultrathin films ofaminophenylthiolate on Cu(100) prepared by vapour phase deposition. Surface Science. 1994;314(1):L849-L856.
Gölzhäuser, A., Panov, S., & Wöll, C. (1994). Determination of molecular orientation in ultrathin films ofaminophenylthiolate on Cu(100) prepared by vapour phase deposition. Surface Science, 314(1), L849-L856. https://doi.org/10.1016/0039-6028(94)90206-2
Gölzhäuser, A., Panov, S., and Wöll, C. (1994). Determination of molecular orientation in ultrathin films ofaminophenylthiolate on Cu(100) prepared by vapour phase deposition. Surface Science 314, L849-L856.
Gölzhäuser, A., Panov, S., & Wöll, C., 1994. Determination of molecular orientation in ultrathin films ofaminophenylthiolate on Cu(100) prepared by vapour phase deposition. Surface Science, 314(1), p L849-L856.
A. Gölzhäuser, S. Panov, and C. Wöll, “Determination of molecular orientation in ultrathin films ofaminophenylthiolate on Cu(100) prepared by vapour phase deposition”, Surface Science, vol. 314, 1994, pp. L849-L856.
Gölzhäuser, A., Panov, S., Wöll, C.: Determination of molecular orientation in ultrathin films ofaminophenylthiolate on Cu(100) prepared by vapour phase deposition. Surface Science. 314, L849-L856 (1994).
Gölzhäuser, Armin, Panov, S., and Wöll, Ch. “Determination of molecular orientation in ultrathin films ofaminophenylthiolate on Cu(100) prepared by vapour phase deposition”. Surface Science 314.1 (1994): L849-L856.
Alle Dateien verfügbar unter der/den folgenden Lizenz(en):
Copyright Statement:
Dieses Objekt ist durch das Urheberrecht und/oder verwandte Schutzrechte geschützt. [...]
Volltext(e)
Access Level
OA Open Access
Zuletzt Hochgeladen
2019-09-06T08:48:18Z
MD5 Prüfsumme
42525ede2b79966e6c420187976ef426

Export

Markieren/ Markierung löschen
Markierte Publikationen

Open Data PUB

Web of Science

Dieser Datensatz im Web of Science®

Suchen in

Google Scholar