Mean-free-path concept in polycrystalline metals

Vancea J, Reiss G, Hoffmann H (1986)
Physical Review , B 35(12): 6435-6437.

Zeitschriftenaufsatz | Veröffentlicht | Englisch
 
Download
OA
Autor*in
Vancea, Johann; Reiss, GünterUniBi ; Hoffmann, Horst
Abstract / Bemerkung
A crude analysis of the observed thickness dependence of the conductivity in fine-grained metals shows a very weak connection with the resistivity caused by grain-boundary scattering. An "effective intrinsic mean free path" for the whole polycrystal, as introduced in the well-known theory of Mayadas and Shatzkes, cannot explain the observed size effect. It is impossible to define a mean free path for the whole polycrystal, especially if the resistivity is governed by grain-boundary scattering.
Erscheinungsjahr
1986
Zeitschriftentitel
Physical Review , B
Band
35
Ausgabe
12
Seite(n)
6435-6437
ISSN
0163-1829
Page URI
https://pub.uni-bielefeld.de/record/1775436

Zitieren

Vancea J, Reiss G, Hoffmann H. Mean-free-path concept in polycrystalline metals. Physical Review , B. 1986;35(12):6435-6437.
Vancea, J., Reiss, G., & Hoffmann, H. (1986). Mean-free-path concept in polycrystalline metals. Physical Review , B, 35(12), 6435-6437. doi:10.1103/PhysRevB.35.6435
Vancea, J., Reiss, G., and Hoffmann, H. (1986). Mean-free-path concept in polycrystalline metals. Physical Review , B 35, 6435-6437.
Vancea, J., Reiss, G., & Hoffmann, H., 1986. Mean-free-path concept in polycrystalline metals. Physical Review , B, 35(12), p 6435-6437.
J. Vancea, G. Reiss, and H. Hoffmann, “Mean-free-path concept in polycrystalline metals”, Physical Review , B, vol. 35, 1986, pp. 6435-6437.
Vancea, J., Reiss, G., Hoffmann, H.: Mean-free-path concept in polycrystalline metals. Physical Review , B. 35, 6435-6437 (1986).
Vancea, Johann, Reiss, Günter, and Hoffmann, Horst. “Mean-free-path concept in polycrystalline metals”. Physical Review , B 35.12 (1986): 6435-6437.
Alle Dateien verfügbar unter der/den folgenden Lizenz(en):
Copyright Statement:
This Item is protected by copyright and/or related rights. [...]
Volltext(e)
Access Level
OA Open Access
Zuletzt Hochgeladen
2019-09-06T08:48:18Z
MD5 Prüfsumme
a78cc577138a734e0fbaf19ce41ad123

5 Zitationen in Europe PMC

Daten bereitgestellt von Europe PubMed Central.

Anomalous electrical transport behavior in nanocrystalline nickel.
Okram GS, Soni A, Rawat R., Nanotechnology 19(18), 2008
PMID: 21825707
Electrically tunable resistance of a metal.
Sagmeister M, Brossmann U, Landgraf S, Würschum R., Phys Rev Lett 96(15), 2006
PMID: 16712180
Electronic transport properties of giant-magnetoresistance Fe/Cr multilayers.
Jacob M, Reiss G, Brückl H, Hoffmann H., Phys Rev B Condens Matter 46(17), 1992
PMID: 10003001
Thickness-dependent thin-film resistivity: Application of quantitative scanning-tunneling-microscopy imaging.
Reiss G, Hastreiter E, Brückl H, Vancea J., Phys Rev B Condens Matter 43(6), 1991
PMID: 9997904
Surface-roughness contributions to the electrical resistivity of polycrystalline metal films.
Jacob U, Vancea J, Hoffmann H., Phys Rev B Condens Matter 41(17), 1990
PMID: 9993634

14 References

Daten bereitgestellt von Europe PubMed Central.


Fuchs, Proc. Cambridge Philos. Soc. 34(), 1938

Sondheimer, Adv. Phys. 1(), 1952

Mayadas, Phys. Rev. B 1(), 1970

Tellier, Thin Solid Films 51(), 1978

Tellier, Thin Solid Films 44(), 1977

Landauer, IBM J. Res. Dev. 1(), 1957

Vancea, Thin Solid Films 121(), 1984

Meaden, 1965

Vancea, Thin Solid Films 129(), 1982

Reiss, J. Phys. C 18(), 1985
Grain-boundary resistance in polycrystalline metals.
Reiss G, Vancea J, Hoffmann H., Phys. Rev. Lett. 56(19), 1986
PMID: 10032857

Ioffe, Can. J. Phys. 34(), 1956

Ioffe, Prog. Semicond. 4(), 1960

Mooij, Phys. Status Solidi A 17(), 1973

Export

Markieren/ Markierung löschen
Markierte Publikationen

Open Data PUB

Web of Science

Dieser Datensatz im Web of Science®

Quellen

PMID: 9940880
PubMed | Europe PMC

Suchen in

Google Scholar