Electronic transport properties and thickness dependence of the giant magnetoresistance in Co/Cu multilayers

Eckl, Th.; Reiss, Günter; Brückl, Hubert; Hoffmann, Horst

Electronic transport properties and thickness dependence of the giant magnetoresistance in Co/Cu multilayers

Eckl T, Reiss G, Brückl H, Hoffmann H (1994)
Journal of applied physics 75(1): 362-367.

Zeitschriftenaufsatz | Veröffentlicht | Englisch

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Reiss_024.pdf

DOI

https://doi.org/10.1063/1.355859

URN

urn:nbn:de:0070-pub-17754312

Autor*in

Eckl, Th.; Reiss, Günter^UniBi ; Brückl, Hubert; Hoffmann, Horst

Einrichtung

Fakultät für Physik > AG Dünne Schichten & Physik der Nanostrukturen

Abstract / Bemerkung

The transport properties of electrons in Co/Cu multilayered thin films are of special interest for the giant magnetoresistance (GMR) of this system. The magnitude of this effect depends on the mean free paths and on the strength of the interface scattering which in turn are strongly related to film structure. In this article, we discuss the results of resistance and magnetoresistance measurements carried out during film growth. We characterize the electronic transport parameters of these films and the growth mechanism of the layers. The new technique of the in situ measurement of the magnetoresistance furthermore provides a tool to find correlations of the growth mechanism with the dependence of the GMR on the Co thickness.

Stichworte

Mean free path; Film growth; Electric conductivity; Thickness; Magnetoresistance; Multilayers; Copper; Cobalt; Scattering; Interfaces

Erscheinungsjahr

1994

Zeitschriftentitel

Journal of applied physics

Band

Ausgabe

Seite(n)

362-367

ISSN

0021-8979

Page URI

https://pub.uni-bielefeld.de/record/1775431

Zitieren

Eckl T, Reiss G, Brückl H, Hoffmann H. Electronic transport properties and thickness dependence of the giant magnetoresistance in Co/Cu multilayers. Journal of applied physics. 1994;75(1):362-367.

Eckl, T., Reiss, G., Brückl, H., & Hoffmann, H. (1994). Electronic transport properties and thickness dependence of the giant magnetoresistance in Co/Cu multilayers. Journal of applied physics, 75(1), 362-367. https://doi.org/10.1063/1.355859

Eckl, Th., Reiss, Günter, Brückl, Hubert, and Hoffmann, Horst. 1994. “Electronic transport properties and thickness dependence of the giant magnetoresistance in Co/Cu multilayers”. Journal of applied physics 75 (1): 362-367.

Eckl, T., Reiss, G., Brückl, H., and Hoffmann, H. (1994). Electronic transport properties and thickness dependence of the giant magnetoresistance in Co/Cu multilayers. Journal of applied physics 75, 362-367.

Eckl, T., et al., 1994. Electronic transport properties and thickness dependence of the giant magnetoresistance in Co/Cu multilayers. Journal of applied physics, 75(1), p 362-367.

T. Eckl, et al., “Electronic transport properties and thickness dependence of the giant magnetoresistance in Co/Cu multilayers”, Journal of applied physics, vol. 75, 1994, pp. 362-367.

Eckl, T., Reiss, G., Brückl, H., Hoffmann, H.: Electronic transport properties and thickness dependence of the giant magnetoresistance in Co/Cu multilayers. Journal of applied physics. 75, 362-367 (1994).

Eckl, Th., Reiss, Günter, Brückl, Hubert, and Hoffmann, Horst. “Electronic transport properties and thickness dependence of the giant magnetoresistance in Co/Cu multilayers”. Journal of applied physics 75.1 (1994): 362-367.

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