Scanning tunneling microscopy on rough surfaces: quantitative image analysis

Reiss G, Brückl H, Vancea J, Lecheler R, Hastreiter E (1991)
Journal of applied physics 70(1): 523-525.

Zeitschriftenaufsatz | Veröffentlicht | Englisch
 
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Abstract / Bemerkung
In this communication, the application of scanning tunneling microscopy (STM) for a quantitative evaluation of roughnesses and mean island sizes of polycrystalline thin films is discussed. Provided strong conditions concerning the resolution are satisfied, the results are in good agreement with standard techniques as, for example, transmission electron microscopy. Owing to its high resolution, STM can supply a better characterization of surfaces than established methods, especially concerning the roughness. Microscopic interpretations of surface dependent physical properties thus can be considerably improved by a quantitative analysis of STM images.
Stichworte
Correlation functions; Resolution methods; High-; Roughness; Thin films; Nickel polycrystals
Erscheinungsjahr
1991
Zeitschriftentitel
Journal of applied physics
Band
70
Ausgabe
1
Seite(n)
523-525
ISSN
0021-8979
Page URI
https://pub.uni-bielefeld.de/record/1775271

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Reiss G, Brückl H, Vancea J, Lecheler R, Hastreiter E. Scanning tunneling microscopy on rough surfaces: quantitative image analysis. Journal of applied physics. 1991;70(1):523-525.
Reiss, G., Brückl, H., Vancea, J., Lecheler, R., & Hastreiter, E. (1991). Scanning tunneling microscopy on rough surfaces: quantitative image analysis. Journal of applied physics, 70(1), 523-525. doi:10.1063/1.350267
Reiss, G., Brückl, H., Vancea, J., Lecheler, R., and Hastreiter, E. (1991). Scanning tunneling microscopy on rough surfaces: quantitative image analysis. Journal of applied physics 70, 523-525.
Reiss, G., et al., 1991. Scanning tunneling microscopy on rough surfaces: quantitative image analysis. Journal of applied physics, 70(1), p 523-525.
G. Reiss, et al., “Scanning tunneling microscopy on rough surfaces: quantitative image analysis”, Journal of applied physics, vol. 70, 1991, pp. 523-525.
Reiss, G., Brückl, H., Vancea, J., Lecheler, R., Hastreiter, E.: Scanning tunneling microscopy on rough surfaces: quantitative image analysis. Journal of applied physics. 70, 523-525 (1991).
Reiss, Günter, Brückl, Hubert, Vancea, Johann, Lecheler, R., and Hastreiter, E. “Scanning tunneling microscopy on rough surfaces: quantitative image analysis”. Journal of applied physics 70.1 (1991): 523-525.
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