Scanning tunneling microscopy on rough surfaces: deconvolution of constant current images

Reiss G, Schneider F, Vancea J, Hoffmann H (1990)
Applied physics letters 57(9): 867-869.

Zeitschriftenaufsatz | Veröffentlicht | Englisch
 
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Autor*in
Reiss, GünterUniBi ; Schneider, F.; Vancea, Johann; Hoffmann, Horst
Abstract / Bemerkung
This letter critically discusses the topographical information obtained by scanning tunneling microscopy (STM) on surfaces with a mesoscopic roughness, i.e., in the range of some nm's. In a foregoing publication [J. Appl. Phys. 67, 1156 (1990)], we already treated the evaluation of constant current images based on the knowledge of the real surface and the shape of the tunneling tip ('tip shape limited resolution'). Now we deal with the invers problem: the reconstruction of the real surface topography based on the corresponding STM image and the tip shape, using a simple, straightforward formalism.
Stichworte
Image processing; Scanning tunneling microscopy; Deconvolution; Roughness; Correlations; Transducers; Surface reconstruction
Erscheinungsjahr
1990
Zeitschriftentitel
Applied physics letters
Band
57
Ausgabe
9
Seite(n)
867-869
ISSN
0003-6951
Page URI
https://pub.uni-bielefeld.de/record/1775236

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Reiss G, Schneider F, Vancea J, Hoffmann H. Scanning tunneling microscopy on rough surfaces: deconvolution of constant current images. Applied physics letters. 1990;57(9):867-869.
Reiss, G., Schneider, F., Vancea, J., & Hoffmann, H. (1990). Scanning tunneling microscopy on rough surfaces: deconvolution of constant current images. Applied physics letters, 57(9), 867-869. doi:10.1063/1.103390
Reiss, G., Schneider, F., Vancea, J., and Hoffmann, H. (1990). Scanning tunneling microscopy on rough surfaces: deconvolution of constant current images. Applied physics letters 57, 867-869.
Reiss, G., et al., 1990. Scanning tunneling microscopy on rough surfaces: deconvolution of constant current images. Applied physics letters, 57(9), p 867-869.
G. Reiss, et al., “Scanning tunneling microscopy on rough surfaces: deconvolution of constant current images”, Applied physics letters, vol. 57, 1990, pp. 867-869.
Reiss, G., Schneider, F., Vancea, J., Hoffmann, H.: Scanning tunneling microscopy on rough surfaces: deconvolution of constant current images. Applied physics letters. 57, 867-869 (1990).
Reiss, Günter, Schneider, F., Vancea, Johann, and Hoffmann, Horst. “Scanning tunneling microscopy on rough surfaces: deconvolution of constant current images”. Applied physics letters 57.9 (1990): 867-869.
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