Electrical conduction in low-resistivity (quasiamorphous) Ag1-xCux alloys

Vancea J, Pukowietz S, Reiss G, Hoffmann H (1987)
Physical Review , B 35(17): 9067-9072.

Zeitschriftenaufsatz | Veröffentlicht | Englisch
 
Download
OA
DOI
URN
urn:nbn:de:0070-pub-17751892
Autor*in
Vancea, Johann; Pukowietz, S.; Reiss, GünterUniBi ; Hoffmann, Horst
Einrichtung
Fakultät für Physik > AG Dünne Schichten & Physik der Nanostrukturen
Abstract / Bemerkung
UHV-evaporated Ag1-xCux alloy films show a strong dependence of the crystallite sizes on the composition: In the middle of the concentration range, the mean grain size is smaller than 2 nm. The resistivity, however, is much lower than expected for such extremely-fine-grained materials (p < 9 my Omega cm). The electrical transport parameters for these films were obtained from the thickness dependence of the conductivity without any a priori assumptions. It will be shown that the electrical transport in these alloys can be well understood as a limit of the reflection model for the electrical conductivity in polycrystalline metals [G. Reiss, J. Vancea, and H. Hoffmann, Phys. Rev. Lett. 56, 2100 (1986)].
Erscheinungsjahr
1987
Zeitschriftentitel
Physical Review , B
Band
35
Ausgabe
17
Seite(n)
9067-9072
ISSN
0163-1829
Page URI
https://pub.uni-bielefeld.de/record/1775189

Zitieren

Vancea J, Pukowietz S, Reiss G, Hoffmann H. Electrical conduction in low-resistivity (quasiamorphous) Ag1-xCux alloys. Physical Review , B. 1987;35(17):9067-9072.
Vancea, J., Pukowietz, S., Reiss, G., & Hoffmann, H. (1987). Electrical conduction in low-resistivity (quasiamorphous) Ag1-xCux alloys. Physical Review , B, 35(17), 9067-9072. https://doi.org/10.1103/PhysRevB.35.9067
Vancea, Johann, Pukowietz, S., Reiss, Günter, and Hoffmann, Horst. 1987. “Electrical conduction in low-resistivity (quasiamorphous) Ag1-xCux alloys”. Physical Review , B 35 (17): 9067-9072.
Vancea, J., Pukowietz, S., Reiss, G., and Hoffmann, H. (1987). Electrical conduction in low-resistivity (quasiamorphous) Ag1-xCux alloys. Physical Review , B 35, 9067-9072.
Vancea, J., et al., 1987. Electrical conduction in low-resistivity (quasiamorphous) Ag1-xCux alloys. Physical Review , B, 35(17), p 9067-9072.
J. Vancea, et al., “Electrical conduction in low-resistivity (quasiamorphous) Ag1-xCux alloys”, Physical Review , B, vol. 35, 1987, pp. 9067-9072.
Vancea, J., Pukowietz, S., Reiss, G., Hoffmann, H.: Electrical conduction in low-resistivity (quasiamorphous) Ag1-xCux alloys. Physical Review , B. 35, 9067-9072 (1987).
Vancea, Johann, Pukowietz, S., Reiss, Günter, and Hoffmann, Horst. “Electrical conduction in low-resistivity (quasiamorphous) Ag1-xCux alloys”. Physical Review , B 35.17 (1987): 9067-9072.
Alle Dateien verfügbar unter der/den folgenden Lizenz(en):
Copyright Statement:
Dieses Objekt ist durch das Urheberrecht und/oder verwandte Schutzrechte geschützt. [...]
Volltext(e)
Name
Access Level
OA Open Access
Zuletzt Hochgeladen
2019-09-06T08:48:17Z
MD5 Prüfsumme
b6cb0c280c893530ce7be6f772e09be2


Zitationen in Europe PMC

Daten bereitgestellt von Europe PubMed Central.

24 References

Daten bereitgestellt von Europe PubMed Central.


AUTHOR UNKNOWN, 1985

AUTHOR UNKNOWN, 1982

AUTHOR UNKNOWN, thin solid films 129(), 1982

AUTHOR UNKNOWN, 1958

Reiss, Journal of Physics C Solid State Physics 18(21), 1985

Mizutani, Journal of Physics F Metal Physics 12(10), 1982
Grain-boundary resistance in polycrystalline metals.
Reiss G, Vancea J, Hoffmann H., Phys. Rev. Lett. 56(19), 1986
PMID: 10032857
Electrical-Resistivity Model for Polycrystalline Films: the Case of Arbitrary Reflection at External Surfaces
Mayadas, Physical Review B 1(4), 1970
Mean free path and density of conductance electrons in platinum determined by the size effect in extremely thin films
Fischer, Physical Review B 22(12), 1980
Transmission resonances and the localization length in one-dimensional disordered systems
Azbel, Physical Review B 27(2), 1983
Ordered structures in “amorphous” Fe-B-alloys
ZWECK, Journal of Magnetism and Magnetic Materials 45(2-3), 1984
Critical assessment of thickness-dependent conductivity of thin metal films
HOFFMANN, Thin Solid Films 85(2), 1981
Surface scattering of electrons in metals
Hoffmann, Thin Solid Films 129(3-4), 1985
Electrical resistivity and electron energy loss spectra of amorphous and crystalline thin Cu-Ag films☆
REDA, Thin Solid Films 116(1-3), 1984
A theoretical description of grain boundary electron scattering by an effective mean free path
TELLIER, Thin Solid Films 51(3), 1978
The Mayadas-Shatzkes conduction model treated as a Fuchs-Sondheimer model
TELLIER, Thin Solid Films 44(2), 1977
Use of thin films for studying order-disorder transformations☆
GANDAIS, Thin Solid Films 12(2), 1972
Metastable evaporated thin films of CuAg and CoAu alloys—I occurrence and morphology of phases
MADER, Acta Metallurgica 15(2), 1967
Resistivity and Temperature Coefficient of Thin Metal Films with Rough Surface
Namba, Japanese Journal of Applied Physics 9(11), 1970
The mean free path of electrons in metals
Sondheimer, Advances In Physics 1(1), 1952
Electron transport properties of amorphous Cu-Ag films
Chopra, physica status solidi (a) 40(1), 1977
Amorphous CuAg Films with High Stability
Reda, physica status solidi (a) 72(1), 1982
A theory of the electrical properties of liquid metals
Faber, Philosophical Magazine 11(109), 1965
The conductivity of thin metallic films according to the electron theory of metals
Fuchs, Mathematical Proceedings of the Cambridge Philosophical Society 34(1), 1938
Export

Markieren/ Markierung löschen
Markierte Publikationen

Open Data PUB

Web of Science

Dieser Datensatz im Web of Science®
Quellen

PMID: 9941301
PubMed | Europe PMC

Suchen in

Google Scholar