Characterization of the helical undulator HELIOS I in the 520 to 930 eV range using a multilayer polarimeter

Drescher M, Snell G, Kleineberg U, Stock HJ, Müller N, Heinzmann U, Brookes NB (1997)
REVIEW OF SCIENTIFIC INSTRUMENTS 68(5): 1939-1944.

Zeitschriftenaufsatz | Veröffentlicht | Englisch
 
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Autor*in
Drescher, MarkusUniBi; Snell, G; Kleineberg, U; Stock, HJ; Müller, NorbertUniBi; Heinzmann, UlrichUniBi; Brookes, NB
Abstract / Bemerkung
A W/Si multilayer was used to determine the degree of circular polarization of the soft x-ray radiation of the European Synchrotron Radiation Facility helical undulator HELIOS I. The multilayer, manufactured by vapor deposition serves as a wideband tunable polarization analyzer in the photon energy range from 520 to 930 eV. The characterization of the multilayer's analyzing power, varying from 0.82 to 0.25 for these energies, indicates that it operates close to its calculated specifications. The lack of phase-shifters applicable in this energy range was overcome by a detailed analysis of the unpolarized background identified as radiation from the magnetic lattice. In this way, the degree of circular polarization of HELIOS I was determined to exceed 0.85 for hv > 685 eV. (C) 1997 American Institute of Physics.
Erscheinungsjahr
1997
Zeitschriftentitel
REVIEW OF SCIENTIFIC INSTRUMENTS
Band
68
Ausgabe
5
Seite(n)
1939-1944
ISSN
0034-6748
Page URI
https://pub.uni-bielefeld.de/record/1637152

Zitieren

Drescher M, Snell G, Kleineberg U, et al. Characterization of the helical undulator HELIOS I in the 520 to 930 eV range using a multilayer polarimeter. REVIEW OF SCIENTIFIC INSTRUMENTS. 1997;68(5):1939-1944.
Drescher, M., Snell, G., Kleineberg, U., Stock, H. J., Müller, N., Heinzmann, U., & Brookes, N. B. (1997). Characterization of the helical undulator HELIOS I in the 520 to 930 eV range using a multilayer polarimeter. REVIEW OF SCIENTIFIC INSTRUMENTS, 68(5), 1939-1944. https://doi.org/10.1063/1.1148081
Drescher, M., Snell, G., Kleineberg, U., Stock, H. J., Müller, N., Heinzmann, U., and Brookes, N. B. (1997). Characterization of the helical undulator HELIOS I in the 520 to 930 eV range using a multilayer polarimeter. REVIEW OF SCIENTIFIC INSTRUMENTS 68, 1939-1944.
Drescher, M., et al., 1997. Characterization of the helical undulator HELIOS I in the 520 to 930 eV range using a multilayer polarimeter. REVIEW OF SCIENTIFIC INSTRUMENTS, 68(5), p 1939-1944.
M. Drescher, et al., “Characterization of the helical undulator HELIOS I in the 520 to 930 eV range using a multilayer polarimeter”, REVIEW OF SCIENTIFIC INSTRUMENTS, vol. 68, 1997, pp. 1939-1944.
Drescher, M., Snell, G., Kleineberg, U., Stock, H.J., Müller, N., Heinzmann, U., Brookes, N.B.: Characterization of the helical undulator HELIOS I in the 520 to 930 eV range using a multilayer polarimeter. REVIEW OF SCIENTIFIC INSTRUMENTS. 68, 1939-1944 (1997).
Drescher, Markus, Snell, G, Kleineberg, U, Stock, HJ, Müller, Norbert, Heinzmann, Ulrich, and Brookes, NB. “Characterization of the helical undulator HELIOS I in the 520 to 930 eV range using a multilayer polarimeter”. REVIEW OF SCIENTIFIC INSTRUMENTS 68.5 (1997): 1939-1944.

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