Characterization of magnetic force microscopy probe tip remagnetization for measurements in external in-plane magnetic fields

Weis T, Krug I, Engel D, Ehresmann A, Hoeink V, Schmalhorst J-M, Reiss G (2008)
JOURNAL OF APPLIED PHYSICS 104(12): 123503.

Zeitschriftenaufsatz | Veröffentlicht | Englisch
 
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DOI
Autor*in
Weis, Tanja; Krug, Ingo; Engel, Dieter; Ehresmann, Arno; Hoeink, Volker; Schmalhorst, Jan-MichaelUniBi ; Reiss, GünterUniBi
Einrichtung
Centrum für Biotechnologie > Institut für Biophysik und Nanowissenschaften
Centrum für Biotechnologie > Arbeitsgruppe G. Reiss
Fakultät für Physik > AG Dünne Schichten & Physik der Nanostrukturen
Abstract / Bemerkung
A quantitative analysis of magnetic force microscopy (MFM) images taken in external in-plane magnetic fields is difficult because of the influence of the magnetic field on the magnetization state of the magnetic probe tip. We prepared calibration samples by ion bombardment induced magnetic patterning with a topographically flat magnetic pattern magnetically stable in a certain external magnetic field range for a quantitative characterization of the MFM probe tip magnetization in point-dipole approximation.
Stichworte
calibration; magnetic force microscopy; magnetisation; ion beam effects
Erscheinungsjahr
2008
Zeitschriftentitel
JOURNAL OF APPLIED PHYSICS
Band
104
Ausgabe
12
Art.-Nr.
123503
ISSN
0021-8979
Page URI
https://pub.uni-bielefeld.de/record/1636172

Zitieren

Weis T, Krug I, Engel D, et al. Characterization of magnetic force microscopy probe tip remagnetization for measurements in external in-plane magnetic fields. JOURNAL OF APPLIED PHYSICS. 2008;104(12): 123503.
Weis, T., Krug, I., Engel, D., Ehresmann, A., Hoeink, V., Schmalhorst, J. - M., & Reiss, G. (2008). Characterization of magnetic force microscopy probe tip remagnetization for measurements in external in-plane magnetic fields. JOURNAL OF APPLIED PHYSICS, 104(12), 123503. https://doi.org/10.1063/1.3040025
Weis, Tanja, Krug, Ingo, Engel, Dieter, Ehresmann, Arno, Hoeink, Volker, Schmalhorst, Jan-Michael, and Reiss, Günter. 2008. “Characterization of magnetic force microscopy probe tip remagnetization for measurements in external in-plane magnetic fields”. JOURNAL OF APPLIED PHYSICS 104 (12): 123503.
Weis, T., Krug, I., Engel, D., Ehresmann, A., Hoeink, V., Schmalhorst, J. - M., and Reiss, G. (2008). Characterization of magnetic force microscopy probe tip remagnetization for measurements in external in-plane magnetic fields. JOURNAL OF APPLIED PHYSICS 104:123503.
Weis, T., et al., 2008. Characterization of magnetic force microscopy probe tip remagnetization for measurements in external in-plane magnetic fields. JOURNAL OF APPLIED PHYSICS, 104(12): 123503.
T. Weis, et al., “Characterization of magnetic force microscopy probe tip remagnetization for measurements in external in-plane magnetic fields”, JOURNAL OF APPLIED PHYSICS, vol. 104, 2008, : 123503.
Weis, T., Krug, I., Engel, D., Ehresmann, A., Hoeink, V., Schmalhorst, J.-M., Reiss, G.: Characterization of magnetic force microscopy probe tip remagnetization for measurements in external in-plane magnetic fields. JOURNAL OF APPLIED PHYSICS. 104, : 123503 (2008).
Weis, Tanja, Krug, Ingo, Engel, Dieter, Ehresmann, Arno, Hoeink, Volker, Schmalhorst, Jan-Michael, and Reiss, Günter. “Characterization of magnetic force microscopy probe tip remagnetization for measurements in external in-plane magnetic fields”. JOURNAL OF APPLIED PHYSICS 104.12 (2008): 123503.
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