Time-of-flight photoelectron emission microscopy TOF-PEEM: first results
Spiecker H, Schmidt O, Ziethen C, Menke D, Kleineberg U, Ahuja RC, Merkel M, Heinzmann U, Schonhense G (1998)
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT 406(3): 499-506.
Zeitschriftenaufsatz
| Veröffentlicht | Englisch
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Autor*in
Spiecker, H;
Schmidt, O;
Ziethen, C;
Menke, D;
Kleineberg, U;
Ahuja, RC;
Merkel, M;
Heinzmann, UlrichUniBi;
Schonhense, G
Abstract / Bemerkung
The time structure of the synchrotron radiation at BESSY (Berlin) is used to operate a photoemission electron microscope in a time-of-flight (TOF) mode. The electrons which are emitted from the sample surface with different energies are dispersed in a drift tube subsequent to the imaging optics. The screen of the microscope was replaced by a fast scintillator (tau = 1.4 ns) and the light is detected by an ultra fast gated intensified CCD camera (800 ps gate 1 MHz repetition rate). The resolving power in the energy domain is demonstrated and possible implications on the spatial resolution (chromatic correction) are discussed. Additionally, an improved contrast at very low emission energies is shown. The capability of the setup as an efficient microspectroscopic tool is illustrated. (C) 1998 Elsevier Science B.V. All rights reserved.
Erscheinungsjahr
1998
Zeitschriftentitel
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
Band
406
Ausgabe
3
Seite(n)
499-506
ISSN
0168-9002
Page URI
https://pub.uni-bielefeld.de/record/1625561
Zitieren
Spiecker H, Schmidt O, Ziethen C, et al. Time-of-flight photoelectron emission microscopy TOF-PEEM: first results. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT. 1998;406(3):499-506.
Spiecker, H., Schmidt, O., Ziethen, C., Menke, D., Kleineberg, U., Ahuja, R. C., Merkel, M., et al. (1998). Time-of-flight photoelectron emission microscopy TOF-PEEM: first results. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 406(3), 499-506. https://doi.org/10.1016/S0168-9002(97)01215-1
Spiecker, H, Schmidt, O, Ziethen, C, Menke, D, Kleineberg, U, Ahuja, RC, Merkel, M, Heinzmann, Ulrich, and Schonhense, G. 1998. “Time-of-flight photoelectron emission microscopy TOF-PEEM: first results”. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT 406 (3): 499-506.
Spiecker, H., Schmidt, O., Ziethen, C., Menke, D., Kleineberg, U., Ahuja, R. C., Merkel, M., Heinzmann, U., and Schonhense, G. (1998). Time-of-flight photoelectron emission microscopy TOF-PEEM: first results. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT 406, 499-506.
Spiecker, H., et al., 1998. Time-of-flight photoelectron emission microscopy TOF-PEEM: first results. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 406(3), p 499-506.
H. Spiecker, et al., “Time-of-flight photoelectron emission microscopy TOF-PEEM: first results”, NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, vol. 406, 1998, pp. 499-506.
Spiecker, H., Schmidt, O., Ziethen, C., Menke, D., Kleineberg, U., Ahuja, R.C., Merkel, M., Heinzmann, U., Schonhense, G.: Time-of-flight photoelectron emission microscopy TOF-PEEM: first results. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT. 406, 499-506 (1998).
Spiecker, H, Schmidt, O, Ziethen, C, Menke, D, Kleineberg, U, Ahuja, RC, Merkel, M, Heinzmann, Ulrich, and Schonhense, G. “Time-of-flight photoelectron emission microscopy TOF-PEEM: first results”. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT 406.3 (1998): 499-506.
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