Strong-field multiple ionization of krypton

Maeda H, Dammasch M, Eichmann U, Sandner W, Becker A, Faisal F (2000)
PHYSICAL REVIEW A 62(3).

Zeitschriftenaufsatz | Veröffentlicht | Englisch
 
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Autor/in
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Abstract / Bemerkung
We have investigated the multiple ion yields of Kr, up to Kr4+ as a function of the field intensity, that are measured using a linearly polarized short-pulsed Ti:sapphire laser of lambda = 800 nm in the range of up to mid-10(15) W/cm(2), within an S-matrix model for nonsequential multiple ionization. Experimental data and theoretical predictions are in good agreement and the influence of different nonsequential channels on the measured ion yields are analyzed.
Erscheinungsjahr
2000
Zeitschriftentitel
PHYSICAL REVIEW A
Band
62
Ausgabe
3
ISSN
1050-2947
eISSN
1094-1622
Page URI
https://pub.uni-bielefeld.de/record/1619037

Zitieren

Maeda H, Dammasch M, Eichmann U, Sandner W, Becker A, Faisal F. Strong-field multiple ionization of krypton. PHYSICAL REVIEW A. 2000;62(3).
Maeda, H., Dammasch, M., Eichmann, U., Sandner, W., Becker, A., & Faisal, F. (2000). Strong-field multiple ionization of krypton. PHYSICAL REVIEW A, 62(3). doi:10.1103/PhysRevA.62.035402
Maeda, H., Dammasch, M., Eichmann, U., Sandner, W., Becker, A., and Faisal, F. (2000). Strong-field multiple ionization of krypton. PHYSICAL REVIEW A 62.
Maeda, H., et al., 2000. Strong-field multiple ionization of krypton. PHYSICAL REVIEW A, 62(3).
H. Maeda, et al., “Strong-field multiple ionization of krypton”, PHYSICAL REVIEW A, vol. 62, 2000.
Maeda, H., Dammasch, M., Eichmann, U., Sandner, W., Becker, A., Faisal, F.: Strong-field multiple ionization of krypton. PHYSICAL REVIEW A. 62, (2000).
Maeda, H, Dammasch, M, Eichmann, U, Sandner, W, Becker, A, and Faisal, Farhard. “Strong-field multiple ionization of krypton”. PHYSICAL REVIEW A 62.3 (2000).