Microcharacterization of the surface oxidation of Py/Cu multilayers by scanning X-ray absorption spectromicroscopy

Kleineberg U, Haindl G, Hütten A, Reiss G, Gullikson EM, Jones MS, Mrowka S, Rekawa SB, Underwood JH (2001)
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING 73(4): 515-519.

Zeitschriftenaufsatz | Veröffentlicht | Englisch
 
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Autor*in
Kleineberg, U; Haindl, G; Hütten, AndreasUniBi; Reiss, GünterUniBi ; Gullikson, EM; Jones, MS; Mrowka, S; Rekawa, SB; Underwood, JH
Abstract / Bemerkung
The local surface oxidation of the permalloy Surface layer in Py/Cu GMR multilayers on a micron lateral scale has been analyzed by means of a microspot-X-ray absorption spectromicroscope utilizing synchrotron radiation from the Advanced Light Source bending magnet beamline 6.3.2. Additionally, the GMR multilayer samples prepared by do magnetron sputtering have been analyzed by cross-sectional transmission electron microscopy, hard X-ray reflection and magnetoresistance measurements. The formation of a passivating iron-oxide layer on the sample surface was identified by X-ray absorption near edge structure spectroscopy (XANES) near the Fe-2p edge while no indication for nickel-oxide formation could be found. Small micron-size pits of reduced iron-oxide concentration could be identified by XANES microscopy while the corresponding nickel distribution appeared to be homogeneous. The results are explained in terms of a local breakdown of the passivating oxide layer.
Erscheinungsjahr
2001
Zeitschriftentitel
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING
Band
73
Ausgabe
4
Seite(n)
515-519
ISSN
0947-8396
Page URI
https://pub.uni-bielefeld.de/record/1616180

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Kleineberg U, Haindl G, Hütten A, et al. Microcharacterization of the surface oxidation of Py/Cu multilayers by scanning X-ray absorption spectromicroscopy. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING. 2001;73(4):515-519.
Kleineberg, U., Haindl, G., Hütten, A., Reiss, G., Gullikson, E. M., Jones, M. S., Mrowka, S., et al. (2001). Microcharacterization of the surface oxidation of Py/Cu multilayers by scanning X-ray absorption spectromicroscopy. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 73(4), 515-519. https://doi.org/10.1007/s003390100801
Kleineberg, U, Haindl, G, Hütten, Andreas, Reiss, Günter, Gullikson, EM, Jones, MS, Mrowka, S, Rekawa, SB, and Underwood, JH. 2001. “Microcharacterization of the surface oxidation of Py/Cu multilayers by scanning X-ray absorption spectromicroscopy”. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING 73 (4): 515-519.
Kleineberg, U., Haindl, G., Hütten, A., Reiss, G., Gullikson, E. M., Jones, M. S., Mrowka, S., Rekawa, S. B., and Underwood, J. H. (2001). Microcharacterization of the surface oxidation of Py/Cu multilayers by scanning X-ray absorption spectromicroscopy. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING 73, 515-519.
Kleineberg, U., et al., 2001. Microcharacterization of the surface oxidation of Py/Cu multilayers by scanning X-ray absorption spectromicroscopy. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 73(4), p 515-519.
U. Kleineberg, et al., “Microcharacterization of the surface oxidation of Py/Cu multilayers by scanning X-ray absorption spectromicroscopy”, APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, vol. 73, 2001, pp. 515-519.
Kleineberg, U., Haindl, G., Hütten, A., Reiss, G., Gullikson, E.M., Jones, M.S., Mrowka, S., Rekawa, S.B., Underwood, J.H.: Microcharacterization of the surface oxidation of Py/Cu multilayers by scanning X-ray absorption spectromicroscopy. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING. 73, 515-519 (2001).
Kleineberg, U, Haindl, G, Hütten, Andreas, Reiss, Günter, Gullikson, EM, Jones, MS, Mrowka, S, Rekawa, SB, and Underwood, JH. “Microcharacterization of the surface oxidation of Py/Cu multilayers by scanning X-ray absorption spectromicroscopy”. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING 73.4 (2001): 515-519.
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