Magnetic and mossbauer study of Fe/Si multilayers

Lucinski T, Kopcewicz M, Hütten A, Brückl H, Heitmann S, Hempel T, Reiss G (2003)
In: Journal of Applied Physics. JOURNAL OF APPLIED PHYSICS, 93(10). AMER INST PHYSICS: 6501-6503.

Konferenzbeitrag | Veröffentlicht | Englisch
 
Download
Es wurden keine Dateien hochgeladen. Nur Publikationsnachweis!
Autor*in
Lucinski, T; Kopcewicz, M; Hütten, AndreasUniBi; Brückl, Hubert; Heitmann, S; Hempel, T; Reiss, GünterUniBi
Abstract / Bemerkung
The magnetic and structural properties of Fe/Si multilayers (Mls) have been studied by x-ray diffraction (XRD) and conversion electron Mossbauer spectroscopy (CEMS) methods. Strong antiferromagnetic (AF) coupling J=-1.93 mJ/m(2) accompanied by saturation field of 1.5 T has been found for Si layer thickness d(Si)=1.4 nm. Magnetic moment measurements of Fe/Si Mls vs Fe thickness revealed that 0.25 nm of Fe per single interface is magnetically inactive. The CEMS spectra recorded at room temperature consist of the Zeeman sextet characteristic of the pure Fe phase (hyperfine field of about 32.8 T) accompanied by two spectral components related to FeSi system: magnetic broad sextet and a quadrupole doublet. The broad sextet could originate from various Fe sites at the interface. The nonmagnetic quadrupole split (QS) doublet is most probably associated with the nonstoichiometric c-Fe1-xSix phase. For larger Si layer thickness (d(Si)>2 nm) the spectral contribution of the QS doublet increases from 5.7% to about 16%. (C) 2003 American Institute of Physics.
Erscheinungsjahr
2003
Titel des Konferenzbandes
Journal of Applied Physics
Band
93
Ausgabe
10
Seite(n)
6501-6503
ISSN
0021-8979
Page URI
https://pub.uni-bielefeld.de/record/1611723

Zitieren

Lucinski T, Kopcewicz M, Hütten A, et al. Magnetic and mossbauer study of Fe/Si multilayers. In: Journal of Applied Physics. JOURNAL OF APPLIED PHYSICS. Vol 93. AMER INST PHYSICS; 2003: 6501-6503.
Lucinski, T., Kopcewicz, M., Hütten, A., Brückl, H., Heitmann, S., Hempel, T., & Reiss, G. (2003). Magnetic and mossbauer study of Fe/Si multilayers. Journal of Applied Physics, JOURNAL OF APPLIED PHYSICS, 93, 6501-6503. AMER INST PHYSICS. doi:10.1063/1.1558656
Lucinski, T., Kopcewicz, M., Hütten, A., Brückl, H., Heitmann, S., Hempel, T., and Reiss, G. (2003). “Magnetic and mossbauer study of Fe/Si multilayers” in Journal of Applied Physics JOURNAL OF APPLIED PHYSICS, vol. 93, (AMER INST PHYSICS), 6501-6503.
Lucinski, T., et al., 2003. Magnetic and mossbauer study of Fe/Si multilayers. In Journal of Applied Physics. JOURNAL OF APPLIED PHYSICS. no.93 AMER INST PHYSICS, pp. 6501-6503.
T. Lucinski, et al., “Magnetic and mossbauer study of Fe/Si multilayers”, Journal of Applied Physics, JOURNAL OF APPLIED PHYSICS, vol. 93, AMER INST PHYSICS, 2003, pp.6501-6503.
Lucinski, T., Kopcewicz, M., Hütten, A., Brückl, H., Heitmann, S., Hempel, T., Reiss, G.: Magnetic and mossbauer study of Fe/Si multilayers. Journal of Applied Physics. JOURNAL OF APPLIED PHYSICS. 93, p. 6501-6503. AMER INST PHYSICS (2003).
Lucinski, T, Kopcewicz, M, Hütten, Andreas, Brückl, Hubert, Heitmann, S, Hempel, T, and Reiss, Günter. “Magnetic and mossbauer study of Fe/Si multilayers”. Journal of Applied Physics. AMER INST PHYSICS, 2003.Vol. 93. JOURNAL OF APPLIED PHYSICS. 6501-6503.

Export

Markieren/ Markierung löschen
Markierte Publikationen

Open Data PUB

Web of Science

Dieser Datensatz im Web of Science®

Suchen in

Google Scholar