Temperature and bias voltage dependence of Co-Fe-AlOX-Py-AlOX-Co-Fe double-barrier junctions
Thomas A, Brückl H, Schmalhorst J-M, Reiss G (2003)
In: IEEE Transactions on Magnetics. IEEE TRANSACTIONS ON MAGNETICS, 39(5). IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC: 2821-2823.
Konferenzbeitrag
| Veröffentlicht | Englisch
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Abstract / Bemerkung
Exchange-biased magnetic tunnel junctions with single and double barriers are investigated with respect to the temperature and bias voltage dependence of the tunneling magneto resistance. The single-barrier junctions show a tunneling magnetoresistance ratio of up to 49% at room temperature (72% at 10 K), the double-barrier systems up to 38% (57%), respectively, with three clearly separated magnetic states. The temperature and bias voltage dependence of the double-barrier junctions is explained as a serial connection of two single junctions. Theoretical studies of the tunneling magnetoresistance exhibit that the magnetoresistance ratio can be enhanced by ballistic electrons in double-barrier junctions, but only if the potential of the middle electrode can be shifted.
Stichworte
double-barrier junctions;
magnetic tunnel junctions
Erscheinungsjahr
2003
Titel des Konferenzbandes
IEEE Transactions on Magnetics
Serien- oder Zeitschriftentitel
IEEE TRANSACTIONS ON MAGNETICS
Band
39
Ausgabe
5
Seite(n)
2821-2823
ISSN
0018-9464
Page URI
https://pub.uni-bielefeld.de/record/1609984
Zitieren
Thomas A, Brückl H, Schmalhorst J-M, Reiss G. Temperature and bias voltage dependence of Co-Fe-AlOX-Py-AlOX-Co-Fe double-barrier junctions. In: IEEE Transactions on Magnetics. IEEE TRANSACTIONS ON MAGNETICS. Vol 39. IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC; 2003: 2821-2823.
Thomas, A., Brückl, H., Schmalhorst, J. - M., & Reiss, G. (2003). Temperature and bias voltage dependence of Co-Fe-AlOX-Py-AlOX-Co-Fe double-barrier junctions. IEEE Transactions on Magnetics, IEEE TRANSACTIONS ON MAGNETICS, 39, 2821-2823. IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC. https://doi.org/10.1109/TMAG.2003.815723
Thomas, Andy, Brückl, Hubert, Schmalhorst, Jan-Michael, and Reiss, Günter. 2003. “Temperature and bias voltage dependence of Co-Fe-AlOX-Py-AlOX-Co-Fe double-barrier junctions”. In IEEE Transactions on Magnetics, 39:2821-2823. IEEE TRANSACTIONS ON MAGNETICS. IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC.
Thomas, A., Brückl, H., Schmalhorst, J. - M., and Reiss, G. (2003). “Temperature and bias voltage dependence of Co-Fe-AlOX-Py-AlOX-Co-Fe double-barrier junctions” in IEEE Transactions on Magnetics IEEE TRANSACTIONS ON MAGNETICS, vol. 39, (IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC), 2821-2823.
Thomas, A., et al., 2003. Temperature and bias voltage dependence of Co-Fe-AlOX-Py-AlOX-Co-Fe double-barrier junctions. In IEEE Transactions on Magnetics. IEEE TRANSACTIONS ON MAGNETICS. no.39 IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, pp. 2821-2823.
A. Thomas, et al., “Temperature and bias voltage dependence of Co-Fe-AlOX-Py-AlOX-Co-Fe double-barrier junctions”, IEEE Transactions on Magnetics, IEEE TRANSACTIONS ON MAGNETICS, vol. 39, IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 2003, pp.2821-2823.
Thomas, A., Brückl, H., Schmalhorst, J.-M., Reiss, G.: Temperature and bias voltage dependence of Co-Fe-AlOX-Py-AlOX-Co-Fe double-barrier junctions. IEEE Transactions on Magnetics. IEEE TRANSACTIONS ON MAGNETICS. 39, p. 2821-2823. IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC (2003).
Thomas, Andy, Brückl, Hubert, Schmalhorst, Jan-Michael, and Reiss, Günter. “Temperature and bias voltage dependence of Co-Fe-AlOX-Py-AlOX-Co-Fe double-barrier junctions”. IEEE Transactions on Magnetics. IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 2003.Vol. 39. IEEE TRANSACTIONS ON MAGNETICS. 2821-2823.
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