Interface structure and magnetism of magnetic tunnel junctions with a Co2MnSi electrode

Schmalhorst J-M, Kammerer S, Sacher M, Reiss G, Hütten A, Scholl A (2004)
PHYSICAL REVIEW B 70(2): 024426.

Zeitschriftenaufsatz | Veröffentlicht | Englisch
 
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Abstract / Bemerkung
Magnetic tunnel junctions with a magnetically soft Heusler-alloy electrode (Co2MnSi/Al+oxidation+in situ annealing/Co7Fe3/Mn83Ir17) and a maximal tunnel magnetoresistance effect of 86% at 10 K/10 mV are investigated with respect to their structural and magnetic properties at the lower barrier interface by electron and x-ray absorption spectroscopy. A plasma-oxidation-induced Mn/Si segregation and oxide formation at the barrier interface is found, which results in a strongly increased area-resistance product of the junctions, because of an enlarged barrier thickness. For Co2MnSi thickness equal to 8 nm or larger, ferromagnetic order of Mn and Co spins at the interface is induced by annealing; simultaneously, atomic ordering at the interface is observed. The influence of the structural and magnetic interface properties on the temperature-dependent transport properties of the junctions is discussed.
Erscheinungsjahr
2004
Zeitschriftentitel
PHYSICAL REVIEW B
Band
70
Ausgabe
2
Art.-Nr.
024426
ISSN
1098-0121
eISSN
1550-235X
Page URI
https://pub.uni-bielefeld.de/record/1607133

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Schmalhorst J-M, Kammerer S, Sacher M, Reiss G, Hütten A, Scholl A. Interface structure and magnetism of magnetic tunnel junctions with a Co2MnSi electrode. PHYSICAL REVIEW B. 2004;70(2): 024426.
Schmalhorst, J. - M., Kammerer, S., Sacher, M., Reiss, G., Hütten, A., & Scholl, A. (2004). Interface structure and magnetism of magnetic tunnel junctions with a Co2MnSi electrode. PHYSICAL REVIEW B, 70(2), 024426. doi:10.1103/PhysRevB.70.024426
Schmalhorst, J. - M., Kammerer, S., Sacher, M., Reiss, G., Hütten, A., and Scholl, A. (2004). Interface structure and magnetism of magnetic tunnel junctions with a Co2MnSi electrode. PHYSICAL REVIEW B 70:024426.
Schmalhorst, J.-M., et al., 2004. Interface structure and magnetism of magnetic tunnel junctions with a Co2MnSi electrode. PHYSICAL REVIEW B, 70(2): 024426.
J.-M. Schmalhorst, et al., “Interface structure and magnetism of magnetic tunnel junctions with a Co2MnSi electrode”, PHYSICAL REVIEW B, vol. 70, 2004, : 024426.
Schmalhorst, J.-M., Kammerer, S., Sacher, M., Reiss, G., Hütten, A., Scholl, A.: Interface structure and magnetism of magnetic tunnel junctions with a Co2MnSi electrode. PHYSICAL REVIEW B. 70, : 024426 (2004).
Schmalhorst, Jan-Michael, Kammerer, S, Sacher, Marc, Reiss, Günter, Hütten, Andreas, and Scholl, A. “Interface structure and magnetism of magnetic tunnel junctions with a Co2MnSi electrode”. PHYSICAL REVIEW B 70.2 (2004): 024426.

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