Exchange interlayer coupling in Fe/SixFe100-x and Co/Si multilayers
Lucinski T, Wandziuk P, Stobiecki F, Andrzejewski B, Kopcewicz M, Hütten A, Reiss G, Szuszkiewicz W (2004)
In: Journal of Magnetism and Magnetic Materials. JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 282. ELSEVIER SCIENCE BV: 248-251.
Konferenzbeitrag
| Veröffentlicht | Englisch
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Autor*in
Lucinski, T;
Wandziuk, P;
Stobiecki, F;
Andrzejewski, B;
Kopcewicz, M;
Hütten, AndreasUniBi;
Reiss, GünterUniBi 
;
Szuszkiewicz, W
;
Szuszkiewicz, WEinrichtung
Abstract / Bemerkung
The Fe/SixFe100-x and Co/Si multilayers have been examined. The strongest antiferromagnetic interlayer coupling, J = -1.94 mJ/m(2), was found in Fe/SixFe100-x multilayers for x = 100. The analysis of the temperature dependences of remanence to saturation magnetization ratios allowed to find the value of semiconductor spacer layer energy gap (E-g approximate to 200 meV) of the examined structures. It suggests that the Fe-Si phase, responsible for antiferromagnetic coupling is an amorphous-like Fe-Si phase. For Co/Si multilayers a very weak exchange coupling and its oscillatory behavior was observed. It was shown that the growth of the Co on Si occurs in an island growth mode. The evolution of magnetic loop shapes can be successfully explained by the interplay between interlayer coupling and anisotropy terms. (C) 2004 Elsevier B.V. All rights reserved.
Stichworte
interfaces;
multilayers;
exchange coupling
Erscheinungsjahr
2004
Titel des Konferenzbandes
Journal of Magnetism and Magnetic Materials
Serien- oder Zeitschriftentitel
JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS
Band
282
Seite(n)
248-251
ISSN
0304-8853
Page URI
https://pub.uni-bielefeld.de/record/1606031
Zitieren
Lucinski T, Wandziuk P, Stobiecki F, et al. Exchange interlayer coupling in Fe/SixFe100-x and Co/Si multilayers. In: Journal of Magnetism and Magnetic Materials. JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS. Vol 282. ELSEVIER SCIENCE BV; 2004: 248-251.
Lucinski, T., Wandziuk, P., Stobiecki, F., Andrzejewski, B., Kopcewicz, M., Hütten, A., Reiss, G., et al. (2004). Exchange interlayer coupling in Fe/SixFe100-x and Co/Si multilayers. Journal of Magnetism and Magnetic Materials, JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 282, 248-251. ELSEVIER SCIENCE BV. https://doi.org/10.1016/j.jmmm.2004.04.056
Lucinski, T, Wandziuk, P, Stobiecki, F, Andrzejewski, B, Kopcewicz, M, Hütten, Andreas, Reiss, Günter, and Szuszkiewicz, W. 2004. “Exchange interlayer coupling in Fe/SixFe100-x and Co/Si multilayers”. In Journal of Magnetism and Magnetic Materials, 282:248-251. JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS. ELSEVIER SCIENCE BV.
Lucinski, T., Wandziuk, P., Stobiecki, F., Andrzejewski, B., Kopcewicz, M., Hütten, A., Reiss, G., and Szuszkiewicz, W. (2004). “Exchange interlayer coupling in Fe/SixFe100-x and Co/Si multilayers” in Journal of Magnetism and Magnetic Materials JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, vol. 282, (ELSEVIER SCIENCE BV), 248-251.
Lucinski, T., et al., 2004. Exchange interlayer coupling in Fe/SixFe100-x and Co/Si multilayers. In Journal of Magnetism and Magnetic Materials. JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS. no.282 ELSEVIER SCIENCE BV, pp. 248-251.
T. Lucinski, et al., “Exchange interlayer coupling in Fe/SixFe100-x and Co/Si multilayers”, Journal of Magnetism and Magnetic Materials, JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, vol. 282, ELSEVIER SCIENCE BV, 2004, pp.248-251.
Lucinski, T., Wandziuk, P., Stobiecki, F., Andrzejewski, B., Kopcewicz, M., Hütten, A., Reiss, G., Szuszkiewicz, W.: Exchange interlayer coupling in Fe/SixFe100-x and Co/Si multilayers. Journal of Magnetism and Magnetic Materials. JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS. 282, p. 248-251. ELSEVIER SCIENCE BV (2004).
Lucinski, T, Wandziuk, P, Stobiecki, F, Andrzejewski, B, Kopcewicz, M, Hütten, Andreas, Reiss, Günter, and Szuszkiewicz, W. “Exchange interlayer coupling in Fe/SixFe100-x and Co/Si multilayers”. Journal of Magnetism and Magnetic Materials. ELSEVIER SCIENCE BV, 2004.Vol. 282. JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS. 248-251.
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