Attosecond metrology with controlled light waveforms

Uiberacker M, Goulielmakis E, Kienberger R, Baltuska A, Westerwalbesloh T, Keineberg U, Heinzmann U, Drescher M, Krausz F (2005)
LASER PHYSICS 15(1): 195-204.

Zeitschriftenaufsatz | Veröffentlicht | Englisch
 
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Abstract / Bemerkung
The electric field oscillations of visible light change their sign about 10(15) limes per second, and, therefore, the field strength changes from zero to maximum in less than a femtosecond (10(-15) s). By precisely controlling these oscillations within a very short laser pulse, we were able to demonstrate an apparatus capable of measuring atomic processes with an accuracy of approximately 100 attoseconds (10(-18) s). A controlled, intense 5-femtosecond laser pulse is used to create a 250-attosecond x-ray pulse that triggers the atomic process. The electric field oscillations of the same laser pulse are used to probe the time structure of the process. This measuring technique allows for the tracing of very fast processes in the electron shells of atoms for the first time.
Erscheinungsjahr
2005
Zeitschriftentitel
LASER PHYSICS
Band
15
Ausgabe
1
Seite(n)
195-204
ISSN
1054-660X
Page URI
https://pub.uni-bielefeld.de/record/1605048

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Uiberacker M, Goulielmakis E, Kienberger R, et al. Attosecond metrology with controlled light waveforms. LASER PHYSICS. 2005;15(1):195-204.
Uiberacker, M., Goulielmakis, E., Kienberger, R., Baltuska, A., Westerwalbesloh, T., Keineberg, U., Heinzmann, U., et al. (2005). Attosecond metrology with controlled light waveforms. LASER PHYSICS, 15(1), 195-204.
Uiberacker, M., Goulielmakis, E., Kienberger, R., Baltuska, A., Westerwalbesloh, T., Keineberg, U., Heinzmann, U., Drescher, M., and Krausz, F. (2005). Attosecond metrology with controlled light waveforms. LASER PHYSICS 15, 195-204.
Uiberacker, M., et al., 2005. Attosecond metrology with controlled light waveforms. LASER PHYSICS, 15(1), p 195-204.
M. Uiberacker, et al., “Attosecond metrology with controlled light waveforms”, LASER PHYSICS, vol. 15, 2005, pp. 195-204.
Uiberacker, M., Goulielmakis, E., Kienberger, R., Baltuska, A., Westerwalbesloh, T., Keineberg, U., Heinzmann, U., Drescher, M., Krausz, F.: Attosecond metrology with controlled light waveforms. LASER PHYSICS. 15, 195-204 (2005).
Uiberacker, M, Goulielmakis, E, Kienberger, R, Baltuska, A, Westerwalbesloh, T, Keineberg, U, Heinzmann, Ulrich, Drescher, Markus, and Krausz, F. “Attosecond metrology with controlled light waveforms”. LASER PHYSICS 15.1 (2005): 195-204.