Photoinduced interface charging in multiphoton photoemission from ultrathin Ag films on Si(100)

Schramm S, Dantscher S, Schramm C, Autzen O, Wesenberg C, Hasselbrink E, Pfeiffer W (2007)
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING 88(3): 459-464.

Zeitschriftenaufsatz | Veröffentlicht | Englisch
 
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Abstract / Bemerkung
The fluence dependence of two-photon photoemission and time resolved two-color pump-probe photoemission spectroscopy of a 25 ML thick Ag-film grown on n-doped Si(100) reveal a photoinduced work function reduction that is attributed to a reduction of the surface dipole. Time-resolved two-color pump-probe spectroscopy shows that this reduction persists for at least several microseconds. This and the pump-induced modification of the 4.65 eV two-photon photoemission spectrum indicate that the excitation of long-lived trap states at the Ag-Si interface affects the charge distribution in the Ag film and consequently is responsible for the reduction of the surface dipole.
Erscheinungsjahr
2007
Zeitschriftentitel
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING
Band
88
Ausgabe
3
Seite(n)
459-464
ISSN
0947-8396
eISSN
1432-0630
Page URI
https://pub.uni-bielefeld.de/record/1593647

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Schramm S, Dantscher S, Schramm C, et al. Photoinduced interface charging in multiphoton photoemission from ultrathin Ag films on Si(100). APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING. 2007;88(3):459-464.
Schramm, S., Dantscher, S., Schramm, C., Autzen, O., Wesenberg, C., Hasselbrink, E., & Pfeiffer, W. (2007). Photoinduced interface charging in multiphoton photoemission from ultrathin Ag films on Si(100). APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 88(3), 459-464. doi:10.1007/s00339-007-4048-z
Schramm, S., Dantscher, S., Schramm, C., Autzen, O., Wesenberg, C., Hasselbrink, E., and Pfeiffer, W. (2007). Photoinduced interface charging in multiphoton photoemission from ultrathin Ag films on Si(100). APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING 88, 459-464.
Schramm, S., et al., 2007. Photoinduced interface charging in multiphoton photoemission from ultrathin Ag films on Si(100). APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 88(3), p 459-464.
S. Schramm, et al., “Photoinduced interface charging in multiphoton photoemission from ultrathin Ag films on Si(100)”, APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, vol. 88, 2007, pp. 459-464.
Schramm, S., Dantscher, S., Schramm, C., Autzen, O., Wesenberg, C., Hasselbrink, E., Pfeiffer, W.: Photoinduced interface charging in multiphoton photoemission from ultrathin Ag films on Si(100). APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING. 88, 459-464 (2007).
Schramm, S., Dantscher, S., Schramm, C., Autzen, O., Wesenberg, C., Hasselbrink, E., and Pfeiffer, Walter. “Photoinduced interface charging in multiphoton photoemission from ultrathin Ag films on Si(100)”. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING 88.3 (2007): 459-464.