Dielectric breakdown in Co-Fe-B/MgO/Co-Fe-B magnetic tunnel junction

Khan AA, Schmalhorst J-M, Thomas A, Schebaum O, Reiss G (2008)
JOURNAL OF APPLIED PHYSICS 103(12): 123705.

Zeitschriftenaufsatz | Veröffentlicht | Englisch
 
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Abstract / Bemerkung
The time-dependent dielectric breakdown has been investigated in Co-Fe-B/MgO/Co-Fe-B junctions by voltage ramp experiments and focused on its dependence on the barrier thickness, junction area, polarity of the applied voltage, ramp speed, and annealing temperature. The results suggest that the breakdown voltage strongly depends both on the polarity of the applied voltage and the annealing temperature. Magnetic tunnel junctions (MTJs) with positive bias on the top electrode show higher breakdown voltage than MTJs with negative bias. We found that there is a significant decrease in the breakdown voltage when the annealing temperature is increased above 350 degrees C. (C) 2008 American Institute of Physics.
Erscheinungsjahr
2008
Zeitschriftentitel
JOURNAL OF APPLIED PHYSICS
Band
103
Ausgabe
12
Art.-Nr.
123705
ISSN
0021-8979
Page URI
https://pub.uni-bielefeld.de/record/1587134

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Khan AA, Schmalhorst J-M, Thomas A, Schebaum O, Reiss G. Dielectric breakdown in Co-Fe-B/MgO/Co-Fe-B magnetic tunnel junction. JOURNAL OF APPLIED PHYSICS. 2008;103(12): 123705.
Khan, A. A., Schmalhorst, J. - M., Thomas, A., Schebaum, O., & Reiss, G. (2008). Dielectric breakdown in Co-Fe-B/MgO/Co-Fe-B magnetic tunnel junction. JOURNAL OF APPLIED PHYSICS, 103(12), 123705. https://doi.org/10.1063/1.2939571
Khan, Ayaz Arif, Schmalhorst, Jan-Michael, Thomas, Andy, Schebaum, Oliver, and Reiss, Günter. 2008. “Dielectric breakdown in Co-Fe-B/MgO/Co-Fe-B magnetic tunnel junction”. JOURNAL OF APPLIED PHYSICS 103 (12): 123705.
Khan, A. A., Schmalhorst, J. - M., Thomas, A., Schebaum, O., and Reiss, G. (2008). Dielectric breakdown in Co-Fe-B/MgO/Co-Fe-B magnetic tunnel junction. JOURNAL OF APPLIED PHYSICS 103:123705.
Khan, A.A., et al., 2008. Dielectric breakdown in Co-Fe-B/MgO/Co-Fe-B magnetic tunnel junction. JOURNAL OF APPLIED PHYSICS, 103(12): 123705.
A.A. Khan, et al., “Dielectric breakdown in Co-Fe-B/MgO/Co-Fe-B magnetic tunnel junction”, JOURNAL OF APPLIED PHYSICS, vol. 103, 2008, : 123705.
Khan, A.A., Schmalhorst, J.-M., Thomas, A., Schebaum, O., Reiss, G.: Dielectric breakdown in Co-Fe-B/MgO/Co-Fe-B magnetic tunnel junction. JOURNAL OF APPLIED PHYSICS. 103, : 123705 (2008).
Khan, Ayaz Arif, Schmalhorst, Jan-Michael, Thomas, Andy, Schebaum, Oliver, and Reiss, Günter. “Dielectric breakdown in Co-Fe-B/MgO/Co-Fe-B magnetic tunnel junction”. JOURNAL OF APPLIED PHYSICS 103.12 (2008): 123705.
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