On the difficulties in characterizing ZnO nanowires

Schlenker, E.; Bakin, A.; Weimann, T.; Hinze, P.; Weber, D. H.; Gölzhäuser, Armin; Wehmann, H-H; Waag, A.

On the difficulties in characterizing ZnO nanowires

Schlenker E, Bakin A, Weimann T, Hinze P, Weber DH, Gölzhäuser A, Wehmann H-H, Waag A (2008)
NANOTECHNOLOGY 19(36): 365707.

Zeitschriftenaufsatz | Veröffentlicht | Englisch

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DOI

https://doi.org/10.1088/0957-4484/19/36/365707

Autor*in

Schlenker, E.; Bakin, A.; Weimann, T.; Hinze, P.; Weber, D. H.; Gölzhäuser, Armin^UniBi ; Wehmann, H-H; Waag, A.

Einrichtung

Fakultät für Physik > AG Physik supramolekularer Systeme und Oberflächen
Centrum für Biotechnologie > Arbeitsgruppe A. Gölzhäuser
Centrum für Biotechnologie > Institut für Biophysik und Nanowissenschaften

Abstract / Bemerkung

The electrical properties of single ZnO nanowires grown by vapor phase transport were investigated. While some samples were contacted by Ti/Au electrodes, another set of samples was investigated using a manipulator tip in a low energy electron point-source microscope. The deduced resistivities range from 1 to 10(3) Omega cm. Additionally, the resistivities of nanowires from multiple publications were brought together and compared to the values obtained from our measurements. The overview of all data shows enormous differences (10(-3)-10(5) Omega cm) in the measured resistivities. In order to reveal the origin of the discrepancies, the influence of growth parameters, measuring methods, contact resistances, crystal structures and ambient conditions are investigated and discussed in detail.

Erscheinungsjahr

2008

Zeitschriftentitel

NANOTECHNOLOGY

Band

Ausgabe

Seite(n)

365707

ISSN

0957-4484

eISSN

1361-6528

Page URI

https://pub.uni-bielefeld.de/record/1586855

Zitieren

Schlenker E, Bakin A, Weimann T, et al. On the difficulties in characterizing ZnO nanowires. NANOTECHNOLOGY. 2008;19(36):365707.

Schlenker, E., Bakin, A., Weimann, T., Hinze, P., Weber, D. H., Gölzhäuser, A., Wehmann, H. - H., et al. (2008). On the difficulties in characterizing ZnO nanowires. NANOTECHNOLOGY, 19(36), 365707. https://doi.org/10.1088/0957-4484/19/36/365707

Schlenker, E., Bakin, A., Weimann, T., Hinze, P., Weber, D. H., Gölzhäuser, Armin, Wehmann, H-H, and Waag, A. 2008. “On the difficulties in characterizing ZnO nanowires”. NANOTECHNOLOGY 19 (36): 365707.

Schlenker, E., Bakin, A., Weimann, T., Hinze, P., Weber, D. H., Gölzhäuser, A., Wehmann, H. - H., and Waag, A. (2008). On the difficulties in characterizing ZnO nanowires. NANOTECHNOLOGY 19, 365707.

Schlenker, E., et al., 2008. On the difficulties in characterizing ZnO nanowires. NANOTECHNOLOGY, 19(36), p 365707.

E. Schlenker, et al., “On the difficulties in characterizing ZnO nanowires”, NANOTECHNOLOGY, vol. 19, 2008, pp. 365707.

Schlenker, E., Bakin, A., Weimann, T., Hinze, P., Weber, D.H., Gölzhäuser, A., Wehmann, H.-H., Waag, A.: On the difficulties in characterizing ZnO nanowires. NANOTECHNOLOGY. 19, 365707 (2008).

Schlenker, E., Bakin, A., Weimann, T., Hinze, P., Weber, D. H., Gölzhäuser, Armin, Wehmann, H-H, and Waag, A. “On the difficulties in characterizing ZnO nanowires”. NANOTECHNOLOGY 19.36 (2008): 365707.

Daten bereitgestellt von European Bioinformatics Institute (EBI)

9 Zitationen in Europe PMC

Daten bereitgestellt von Europe PubMed Central.

Mitigating the photocurrent persistence of single ZnO nanowires for low noise photodetection applications.
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Chiu SP, Lu JG, Lin JJ., Nanotechnology 24(24), 2013
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Tsai LT, Chiu SP, Lu JG, Lin JJ., Nanotechnology 21(14), 2010
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Chiu SP, Lin YH, Lin JJ., Nanotechnology 20(1), 2009
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He JH, Chang PH, Chen CY, Tsai KT., Nanotechnology 20(13), 2009
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Atanasova P, Weitz RT, Gerstel P, Srot V, Kopold P, van Aken PA, Burghard M, Bill J., Nanotechnology 20(36), 2009
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