Direct imaging of the structural change generated by dielectric breakdown in MgO based magnetic tunnel junctions
Thomas A, Drewello V, Schäfers M, Weddemann A, Reiss G, Eilers G, Muenzenberg M, Thiel K, Seibt M (2008)
APPLIED PHYSICS LETTERS 93(15): 152508.
Zeitschriftenaufsatz
| Veröffentlicht | Englisch
Download
Es wurden keine Dateien hochgeladen. Nur Publikationsnachweis!
Autor*in
Thomas, AndyUniBi 
;
Drewello, VolkerUniBi;
Schäfers, MarkusUniBi;
Weddemann, AlexanderUniBi;
Reiss, GünterUniBi ;
Eilers, G.;
Muenzenberg, M.;
Thiel, K.;
Seibt, M.
;
Drewello, VolkerUniBi;
Schäfers, MarkusUniBi;
Weddemann, AlexanderUniBi;
Reiss, GünterUniBi ;
Eilers, G.;
Muenzenberg, M.;
Thiel, K.;
Seibt, M.Einrichtung
Abstract / Bemerkung
MgO based magnetic tunnel junctions are prepared to investigate the dielectric breakdown of the barrier. The breakdown is visualized by transmission electron microscopy measurements. The broken tunnel junctions are prepared for the microscopy measurements by focused ion beam out of the junctions characterized by transport investigations. A direct comparison of transport behavior and structure of the intact and broken junctions is obtained. The MgO barrier shows many microscopic pinholes after breakdown. This can be explained within a model assuming a relationship between the current density at the breakdown and the rate of pinhole formation. (C) 2008 American Institute of Physics. [DOI: 10.1063/1.3001934]
Erscheinungsjahr
2008
Zeitschriftentitel
APPLIED PHYSICS LETTERS
Band
93
Ausgabe
15
Art.-Nr.
152508
ISSN
0003-6951
Page URI
https://pub.uni-bielefeld.de/record/1585757
Zitieren
Thomas A, Drewello V, Schäfers M, et al. Direct imaging of the structural change generated by dielectric breakdown in MgO based magnetic tunnel junctions. APPLIED PHYSICS LETTERS. 2008;93(15): 152508.
Thomas, A., Drewello, V., Schäfers, M., Weddemann, A., Reiss, G., Eilers, G., Muenzenberg, M., et al. (2008). Direct imaging of the structural change generated by dielectric breakdown in MgO based magnetic tunnel junctions. APPLIED PHYSICS LETTERS, 93(15), 152508. https://doi.org/10.1063/1.3001934
Thomas, Andy, Drewello, Volker, Schäfers, Markus, Weddemann, Alexander, Reiss, Günter, Eilers, G., Muenzenberg, M., Thiel, K., and Seibt, M. 2008. “Direct imaging of the structural change generated by dielectric breakdown in MgO based magnetic tunnel junctions”. APPLIED PHYSICS LETTERS 93 (15): 152508.
Thomas, A., Drewello, V., Schäfers, M., Weddemann, A., Reiss, G., Eilers, G., Muenzenberg, M., Thiel, K., and Seibt, M. (2008). Direct imaging of the structural change generated by dielectric breakdown in MgO based magnetic tunnel junctions. APPLIED PHYSICS LETTERS 93:152508.
Thomas, A., et al., 2008. Direct imaging of the structural change generated by dielectric breakdown in MgO based magnetic tunnel junctions. APPLIED PHYSICS LETTERS, 93(15): 152508.
A. Thomas, et al., “Direct imaging of the structural change generated by dielectric breakdown in MgO based magnetic tunnel junctions”, APPLIED PHYSICS LETTERS, vol. 93, 2008, : 152508.
Thomas, A., Drewello, V., Schäfers, M., Weddemann, A., Reiss, G., Eilers, G., Muenzenberg, M., Thiel, K., Seibt, M.: Direct imaging of the structural change generated by dielectric breakdown in MgO based magnetic tunnel junctions. APPLIED PHYSICS LETTERS. 93, : 152508 (2008).
Thomas, Andy, Drewello, Volker, Schäfers, Markus, Weddemann, Alexander, Reiss, Günter, Eilers, G., Muenzenberg, M., Thiel, K., and Seibt, M. “Direct imaging of the structural change generated by dielectric breakdown in MgO based magnetic tunnel junctions”. APPLIED PHYSICS LETTERS 93.15 (2008): 152508.
Export
Markieren/ Markierung löschen
Markierte Publikationen
Web of Science
Dieser Datensatz im Web of Science®Quellen
arXiv: 0806.2028
Suchen in
Google Scholar