Attractor networks and associative memories with STDP learning in RRAM synapses

Milo V, Ielmini D, Chicca E (2017)
In: 2017 International Electron Devices Meeting. Technical digest. Piscataway, NJ: IEEE: 11.2.1-11.2.4.

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Konferenzbeitrag | Veröffentlicht | Englisch
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Titel des Konferenzbandes
2017 International Electron Devices Meeting. Technical digest
Seite
11.2.1-11.2.4
Konferenz
2017 IEEE International Electron Devices Meeting (IEDM)
Konferenzort
San Francisco, CA USA
Konferenzdatum
2017-12-02 – 2017-12-06
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Milo V, Ielmini D, Chicca E. Attractor networks and associative memories with STDP learning in RRAM synapses. In: 2017 International Electron Devices Meeting. Technical digest. Piscataway, NJ: IEEE; 2017: 11.2.1-11.2.4.
Milo, V., Ielmini, D., & Chicca, E. (2017). Attractor networks and associative memories with STDP learning in RRAM synapses. 2017 International Electron Devices Meeting. Technical digest, 11.2.1-11.2.4. Piscataway, NJ: IEEE. doi:10.1109/IEDM.2017.8268369
Milo, V., Ielmini, D., and Chicca, E. (2017). “Attractor networks and associative memories with STDP learning in RRAM synapses” in 2017 International Electron Devices Meeting. Technical digest (Piscataway, NJ: IEEE), 11.2.1-11.2.4.
Milo, V., Ielmini, D., & Chicca, E., 2017. Attractor networks and associative memories with STDP learning in RRAM synapses. In 2017 International Electron Devices Meeting. Technical digest. Piscataway, NJ: IEEE, pp. 11.2.1-11.2.4.
V. Milo, D. Ielmini, and E. Chicca, “Attractor networks and associative memories with STDP learning in RRAM synapses”, 2017 International Electron Devices Meeting. Technical digest, Piscataway, NJ: IEEE, 2017, pp.11.2.1-11.2.4.
Milo, V., Ielmini, D., Chicca, E.: Attractor networks and associative memories with STDP learning in RRAM synapses. 2017 International Electron Devices Meeting. Technical digest. p. 11.2.1-11.2.4. IEEE, Piscataway, NJ (2017).
Milo, Valerio, Ielmini, Daniele, and Chicca, Elisabetta. “Attractor networks and associative memories with STDP learning in RRAM synapses”. 2017 International Electron Devices Meeting. Technical digest. Piscataway, NJ: IEEE, 2017. 11.2.1-11.2.4.

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