Achieving high effective Q-factors in ultra-high vacuum dynamic force microscopy

Lübbe J, Tröger L, Torbrügge S, Bechstein R, Richter C, Kühnle A, Reichling M (2010)
Measurement Science and Technology 21(12): 125501.

Download
No fulltext has been uploaded. References only!
Journal Article | Original Article | Published | English

No fulltext has been uploaded

Author
; ; ; ; ; ;
Abstract
The effective Q-factor of the cantilever is one of the most important figures-of-merit for a non-contact atomic force microscope (NC-AFM) operated in ultra-high vacuum (UHV). We provide a comprehensive discussion of all effects influencing the Q-factor and compare measured Q-factors to results from simulations based on the dimensions of the cantilevers. We introduce a methodology to investigate in detail how the effective Q-factor depends on the fixation technique of the cantilever. Fixation loss is identified as a most important contribution in addition to the hitherto discussed effects and we describe a strategy for avoiding fixation loss and obtaining high effective Q-factors in the force microscope. We demonstrate for room temperature operation, that an optimum fixation yields an effective Q-factor for the NC-AFM measurement in UHV that is equal to the intrinsic value of the cantilever.
Publishing Year
ISSN
eISSN
PUB-ID

Cite this

Lübbe J, Tröger L, Torbrügge S, et al. Achieving high effective Q-factors in ultra-high vacuum dynamic force microscopy. Measurement Science and Technology. 2010;21(12): 125501.
Lübbe, J., Tröger, L., Torbrügge, S., Bechstein, R., Richter, C., Kühnle, A., & Reichling, M. (2010). Achieving high effective Q-factors in ultra-high vacuum dynamic force microscopy. Measurement Science and Technology, 21(12), 125501. doi:10.1088/0957-0233/21/12/125501
Lübbe, J., Tröger, L., Torbrügge, S., Bechstein, R., Richter, C., Kühnle, A., and Reichling, M. (2010). Achieving high effective Q-factors in ultra-high vacuum dynamic force microscopy. Measurement Science and Technology 21:125501.
Lübbe, J., et al., 2010. Achieving high effective Q-factors in ultra-high vacuum dynamic force microscopy. Measurement Science and Technology, 21(12): 125501.
J. Lübbe, et al., “Achieving high effective Q-factors in ultra-high vacuum dynamic force microscopy”, Measurement Science and Technology, vol. 21, 2010, : 125501.
Lübbe, J., Tröger, L., Torbrügge, S., Bechstein, R., Richter, C., Kühnle, A., Reichling, M.: Achieving high effective Q-factors in ultra-high vacuum dynamic force microscopy. Measurement Science and Technology. 21, : 125501 (2010).
Lübbe, Jannis, Tröger, Lutz, Torbrügge, Stefan, Bechstein, Ralf, Richter, Christoph, Kühnle, Angelika, and Reichling, Michael. “Achieving high effective Q-factors in ultra-high vacuum dynamic force microscopy”. Measurement Science and Technology 21.12 (2010): 125501.
This data publication is cited in the following publications:
This publication cites the following data publications:

Export

0 Marked Publications

Open Data PUB

Web of Science

View record in Web of Science®

Search this title in

Google Scholar