Modification of a commercial atomic force microscopy for low-noise, high-resolution frequency-modulation imaging in liquid environment

Rode S, Stark R, Lübbe J, Tröger L, Schütte J, Umeda K, Kobayashi K, Yamada H, Kühnle A (2011)
Review of Scientific Instruments 82(7): 073703.

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Zeitschriftenaufsatz | Veröffentlicht | Englisch
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Abstract / Bemerkung
A key issue for high-resolution frequency-modulation atomic force microscopy imaging in liquids is minimizing the frequency noise, which requires a detailed analysis of the corresponding noise contributions. In this paper, we present a detailed description for modifying a commercial atomic force microscope (Bruker MultiMode V with Nanoscope V controller), aiming at atomic-resolution frequency-modulation imaging in ambient and in liquid environment. Care was taken to maintain the AFMs original stability and ease of operation. The new system builds upon an optimized light source, a new photodiode and an entirely new amplifier. Moreover, we introduce a home-built liquid cell and sample holder as well as a temperature-stabilized isolation chamber dedicated to low-noise imaging in liquids. The success of these modifications is measured by the reduction in the deflection sensor noise density from initially 100 fm/root Hz to around 10 fm/root Hz after modification. The performance of our instrument is demonstrated by atomically resolved images of calcite taken under liquid conditions. (C) 2011 American Institute of Physics. [doi: 10.1063/1.3606399]
Erscheinungsjahr
Zeitschriftentitel
Review of Scientific Instruments
Band
82
Zeitschriftennummer
7
Seite
073703
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Rode S, Stark R, Lübbe J, et al. Modification of a commercial atomic force microscopy for low-noise, high-resolution frequency-modulation imaging in liquid environment. Review of Scientific Instruments. 2011;82(7):073703.
Rode, S., Stark, R., Lübbe, J., Tröger, L., Schütte, J., Umeda, K., Kobayashi, K., et al. (2011). Modification of a commercial atomic force microscopy for low-noise, high-resolution frequency-modulation imaging in liquid environment. Review of Scientific Instruments, 82(7), 073703. doi:10.1063/1.3606399
Rode, S., Stark, R., Lübbe, J., Tröger, L., Schütte, J., Umeda, K., Kobayashi, K., Yamada, H., and Kühnle, A. (2011). Modification of a commercial atomic force microscopy for low-noise, high-resolution frequency-modulation imaging in liquid environment. Review of Scientific Instruments 82, 073703.
Rode, S., et al., 2011. Modification of a commercial atomic force microscopy for low-noise, high-resolution frequency-modulation imaging in liquid environment. Review of Scientific Instruments, 82(7), p 073703.
S. Rode, et al., “Modification of a commercial atomic force microscopy for low-noise, high-resolution frequency-modulation imaging in liquid environment”, Review of Scientific Instruments, vol. 82, 2011, pp. 073703.
Rode, S., Stark, R., Lübbe, J., Tröger, L., Schütte, J., Umeda, K., Kobayashi, K., Yamada, H., Kühnle, A.: Modification of a commercial atomic force microscopy for low-noise, high-resolution frequency-modulation imaging in liquid environment. Review of Scientific Instruments. 82, 073703 (2011).
Rode, Sebastian, Stark, R., Lübbe, Jannis, Tröger, Lutz, Schütte, Jens, Umeda, K., Kobayashi, Kei, Yamada, Hirofumi, and Kühnle, Angelika. “Modification of a commercial atomic force microscopy for low-noise, high-resolution frequency-modulation imaging in liquid environment”. Review of Scientific Instruments 82.7 (2011): 073703.

7 Zitationen in Europe PMC

Daten bereitgestellt von Europe PubMed Central.

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