Modification of a commercial atomic force microscopy for low-noise, high-resolution frequency-modulation imaging in liquid environment

Rode S, Stark R, Lübbe J, Tröger L, Schütte J, Umeda K, Kobayashi K, Yamada H, Kühnle A (2011)
Review of Scientific Instruments 82(7): 073703.

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A key issue for high-resolution frequency-modulation atomic force microscopy imaging in liquids is minimizing the frequency noise, which requires a detailed analysis of the corresponding noise contributions. In this paper, we present a detailed description for modifying a commercial atomic force microscope (Bruker MultiMode V with Nanoscope V controller), aiming at atomic-resolution frequency-modulation imaging in ambient and in liquid environment. Care was taken to maintain the AFMs original stability and ease of operation. The new system builds upon an optimized light source, a new photodiode and an entirely new amplifier. Moreover, we introduce a home-built liquid cell and sample holder as well as a temperature-stabilized isolation chamber dedicated to low-noise imaging in liquids. The success of these modifications is measured by the reduction in the deflection sensor noise density from initially 100 fm/root Hz to around 10 fm/root Hz after modification. The performance of our instrument is demonstrated by atomically resolved images of calcite taken under liquid conditions. (C) 2011 American Institute of Physics. [doi: 10.1063/1.3606399]
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Rode S, Stark R, Lübbe J, et al. Modification of a commercial atomic force microscopy for low-noise, high-resolution frequency-modulation imaging in liquid environment. Review of Scientific Instruments. 2011;82(7): 073703.
Rode, S., Stark, R., Lübbe, J., Tröger, L., Schütte, J., Umeda, K., Kobayashi, K., et al. (2011). Modification of a commercial atomic force microscopy for low-noise, high-resolution frequency-modulation imaging in liquid environment. Review of Scientific Instruments, 82(7), 073703. doi:10.1063/1.3606399
Rode, S., Stark, R., Lübbe, J., Tröger, L., Schütte, J., Umeda, K., Kobayashi, K., Yamada, H., and Kühnle, A. (2011). Modification of a commercial atomic force microscopy for low-noise, high-resolution frequency-modulation imaging in liquid environment. Review of Scientific Instruments 82:073703.
Rode, S., et al., 2011. Modification of a commercial atomic force microscopy for low-noise, high-resolution frequency-modulation imaging in liquid environment. Review of Scientific Instruments, 82(7): 073703.
S. Rode, et al., “Modification of a commercial atomic force microscopy for low-noise, high-resolution frequency-modulation imaging in liquid environment”, Review of Scientific Instruments, vol. 82, 2011, : 073703.
Rode, S., Stark, R., Lübbe, J., Tröger, L., Schütte, J., Umeda, K., Kobayashi, K., Yamada, H., Kühnle, A.: Modification of a commercial atomic force microscopy for low-noise, high-resolution frequency-modulation imaging in liquid environment. Review of Scientific Instruments. 82, : 073703 (2011).
Rode, Sebastian, Stark, R., Lübbe, Jannis, Tröger, Lutz, Schütte, Jens, Umeda, K., Kobayashi, Kei, Yamada, Hirofumi, and Kühnle, Angelika. “Modification of a commercial atomic force microscopy for low-noise, high-resolution frequency-modulation imaging in liquid environment”. Review of Scientific Instruments 82.7 (2011): 073703.
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