Determining cantilever stiffness from thermal noise

Lübbe J, Temmen M, Rahe P, Kühnle A, Reichling M (2013)
Beilstein Journal of Nanotechnology 4: 227-233.

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Zeitschriftenaufsatz | Veröffentlicht | Englisch
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Abstract / Bemerkung
We critically discuss the extraction of intrinsic cantilever properties, namely eigenfrequency f(n), quality factor Q(n) and specifically the stiffness k(n) of the nth cantilever oscillation mode from thermal noise by an analysis of the power spectral density of displacement fluctuations of the cantilever in contact with a thermal bath. The practical applicability of this approach is demonstrated for several cantilevers with eigenfrequencies ranging from 50 kHz to 2 MHz. As such an analysis requires a sophisticated spectral analysis, we introduce a new method to determine kn from a spectral analysis of the demodulated oscillation signal of the excited cantilever that can be performed in the frequency range of 10 Hz to 1 kHz regardless of the eigenfrequency of the cantilever. We demonstrate that the latter method is in particular useful for noncontact atomic force microscopy (NC-AFM) where the required simple instrumentation for spectral analysis is available in most experimental systems.
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Beilstein Journal of Nanotechnology
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4
Seite
227-233
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Lübbe J, Temmen M, Rahe P, Kühnle A, Reichling M. Determining cantilever stiffness from thermal noise. Beilstein Journal of Nanotechnology. 2013;4:227-233.
Lübbe, J., Temmen, M., Rahe, P., Kühnle, A., & Reichling, M. (2013). Determining cantilever stiffness from thermal noise. Beilstein Journal of Nanotechnology, 4, 227-233. doi:10.3762/bjnano.4.23
Lübbe, J., Temmen, M., Rahe, P., Kühnle, A., and Reichling, M. (2013). Determining cantilever stiffness from thermal noise. Beilstein Journal of Nanotechnology 4, 227-233.
Lübbe, J., et al., 2013. Determining cantilever stiffness from thermal noise. Beilstein Journal of Nanotechnology, 4, p 227-233.
J. Lübbe, et al., “Determining cantilever stiffness from thermal noise”, Beilstein Journal of Nanotechnology, vol. 4, 2013, pp. 227-233.
Lübbe, J., Temmen, M., Rahe, P., Kühnle, A., Reichling, M.: Determining cantilever stiffness from thermal noise. Beilstein Journal of Nanotechnology. 4, 227-233 (2013).
Lübbe, Jannis, Temmen, Matthias, Rahe, Philipp, Kühnle, Angelika, and Reichling, Michael. “Determining cantilever stiffness from thermal noise”. Beilstein Journal of Nanotechnology 4 (2013): 227-233.
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2018-09-03T08:38:58Z

5 Zitationen in Europe PMC

Daten bereitgestellt von Europe PubMed Central.

Exploring wear at the nanoscale with circular mode atomic force microscopy.
Noel O, Vencl A, Mazeran PE., Beilstein J Nanotechnol 8(), 2017
PMID: 29354338
Understanding interferometry for micro-cantilever displacement detection.
von Schmidsfeld A, Nörenberg T, Temmen M, Reichling M., Beilstein J Nanotechnol 7(), 2016
PMID: 27547601
Noise in NC-AFM measurements with significant tip-sample interaction.
Lübbe J, Temmen M, Rahe P, Reichling M., Beilstein J Nanotechnol 7(), 2016
PMID: 28144538

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