Inferring Feature Relevances From Metric Learning

Schulz A, Mokbel B, Biehl M, Hammer B (2015)
In: 2015 IEEE Symposium Series on Computational Intelligence. Institute of Electrical & Electronics Engineers (IEEE).

Conference Paper | Published | English

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Schulz A, Mokbel B, Biehl M, Hammer B. Inferring Feature Relevances From Metric Learning. In: 2015 IEEE Symposium Series on Computational Intelligence. Institute of Electrical & Electronics Engineers (IEEE); 2015.
Schulz, A., Mokbel, B., Biehl, M., & Hammer, B. (2015). Inferring Feature Relevances From Metric Learning. 2015 IEEE Symposium Series on Computational Intelligence.
Schulz, A., Mokbel, B., Biehl, M., and Hammer, B. (2015). “Inferring Feature Relevances From Metric Learning” in 2015 IEEE Symposium Series on Computational Intelligence (Institute of Electrical & Electronics Engineers (IEEE).
Schulz, A., et al., 2015. Inferring Feature Relevances From Metric Learning. In 2015 IEEE Symposium Series on Computational Intelligence. Institute of Electrical & Electronics Engineers (IEEE).
A. Schulz, et al., “Inferring Feature Relevances From Metric Learning”, 2015 IEEE Symposium Series on Computational Intelligence, Institute of Electrical & Electronics Engineers (IEEE), 2015.
Schulz, A., Mokbel, B., Biehl, M., Hammer, B.: Inferring Feature Relevances From Metric Learning. 2015 IEEE Symposium Series on Computational Intelligence. Institute of Electrical & Electronics Engineers (IEEE) (2015).
Schulz, Alexander, Mokbel, Bassam, Biehl, Michael, and Hammer, Barbara. “Inferring Feature Relevances From Metric Learning”. 2015 IEEE Symposium Series on Computational Intelligence. Institute of Electrical & Electronics Engineers (IEEE), 2015.
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