Thickness dependence of the martensitic transformation, magnetism, and magnetoresistance in epitaxial Ni-Mn-Sn ultrathin films

Auge A, Teichert N, Meinert M, Reiss G, Hütten A, Yüzüak E, Dincer I, Elerman Y, Ennen I, Schattschneider P (2012)
Phys. Rev. B 85(21).

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Auge A, Teichert N, Meinert M, et al. Thickness dependence of the martensitic transformation, magnetism, and magnetoresistance in epitaxial Ni-Mn-Sn ultrathin films. Phys. Rev. B. 2012;85(21).
Auge, A., Teichert, N., Meinert, M., Reiss, G., Hütten, A., Yüzüak, E., Dincer, I., et al. (2012). Thickness dependence of the martensitic transformation, magnetism, and magnetoresistance in epitaxial Ni-Mn-Sn ultrathin films. Phys. Rev. B, 85(21). doi:10.1103/physrevb.85.214118
Auge, A., Teichert, N., Meinert, M., Reiss, G., Hütten, A., Yüzüak, E., Dincer, I., Elerman, Y., Ennen, I., and Schattschneider, P. (2012). Thickness dependence of the martensitic transformation, magnetism, and magnetoresistance in epitaxial Ni-Mn-Sn ultrathin films. Phys. Rev. B 85.
Auge, A., et al., 2012. Thickness dependence of the martensitic transformation, magnetism, and magnetoresistance in epitaxial Ni-Mn-Sn ultrathin films. Phys. Rev. B, 85(21).
A. Auge, et al., “Thickness dependence of the martensitic transformation, magnetism, and magnetoresistance in epitaxial Ni-Mn-Sn ultrathin films”, Phys. Rev. B, vol. 85, 2012.
Auge, A., Teichert, N., Meinert, M., Reiss, G., Hütten, A., Yüzüak, E., Dincer, I., Elerman, Y., Ennen, I., Schattschneider, P.: Thickness dependence of the martensitic transformation, magnetism, and magnetoresistance in epitaxial Ni-Mn-Sn ultrathin films. Phys. Rev. B. 85, (2012).
Auge, A., Teichert, Niklas, Meinert, Markus, Reiss, Günter, Hütten, Andreas, Yüzüak, E., Dincer, I., Elerman, Y., Ennen, Inga, and Schattschneider, P. “Thickness dependence of the martensitic transformation, magnetism, and magnetoresistance in epitaxial Ni-Mn-Sn ultrathin films”. Phys. Rev. B 85.21 (2012).
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