Valid interpretation of feature relevance for linear data mappings

Frenay B, Hofmann D, Schulz A, Biehl M, Hammer B (2014)
In: 2014 IEEE Symposium on Computational Intelligence and Data Mining (CIDM). Institute of Electrical & Electronics Engineers (IEEE): 149-156.

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Konferenzbeitrag | Veröffentlicht | Englisch
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Titel des Konferenzbandes
2014 IEEE Symposium on Computational Intelligence and Data Mining (CIDM)
Seite
149 - 156
Konferenz
IEEE Symposium on Computational Intelligence and Data Mining (CIDM)
Konferenzdatum
2014.12.09 – 2014.12.12
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Frenay B, Hofmann D, Schulz A, Biehl M, Hammer B. Valid interpretation of feature relevance for linear data mappings. In: 2014 IEEE Symposium on Computational Intelligence and Data Mining (CIDM). Institute of Electrical & Electronics Engineers (IEEE); 2014: 149-156.
Frenay, B., Hofmann, D., Schulz, A., Biehl, M., & Hammer, B. (2014). Valid interpretation of feature relevance for linear data mappings. 2014 IEEE Symposium on Computational Intelligence and Data Mining (CIDM), 149-156. doi:10.1109/cidm.2014.7008661
Frenay, B., Hofmann, D., Schulz, A., Biehl, M., and Hammer, B. (2014). “Valid interpretation of feature relevance for linear data mappings” in 2014 IEEE Symposium on Computational Intelligence and Data Mining (CIDM) (Institute of Electrical & Electronics Engineers (IEEE), 149-156.
Frenay, B., et al., 2014. Valid interpretation of feature relevance for linear data mappings. In 2014 IEEE Symposium on Computational Intelligence and Data Mining (CIDM). Institute of Electrical & Electronics Engineers (IEEE), pp. 149-156.
B. Frenay, et al., “Valid interpretation of feature relevance for linear data mappings”, 2014 IEEE Symposium on Computational Intelligence and Data Mining (CIDM), Institute of Electrical & Electronics Engineers (IEEE), 2014, pp.149-156.
Frenay, B., Hofmann, D., Schulz, A., Biehl, M., Hammer, B.: Valid interpretation of feature relevance for linear data mappings. 2014 IEEE Symposium on Computational Intelligence and Data Mining (CIDM). p. 149-156. Institute of Electrical & Electronics Engineers (IEEE) (2014).
Frenay, Benoit, Hofmann, Daniela, Schulz, Alexander, Biehl, Michael, and Hammer, Barbara. “Valid interpretation of feature relevance for linear data mappings”. 2014 IEEE Symposium on Computational Intelligence and Data Mining (CIDM). Institute of Electrical & Electronics Engineers (IEEE), 2014. 149-156.

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