Exploiting Dynamic Partial Reconfiguration for On-Line On-Demand Testing of Permanent Faults in Reconfigurable Systems

Sorrenti D, Cozzi D, Korf S, Cassano L, Hagemeyer J, Porrmann M, Bernadeschi C (2014)
Presented at the 17th IEEE Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Amsterdam, The Netherlands.

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Konferenzbeitrag | Veröffentlicht | Englisch
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Erscheinungsjahr
Konferenz
17th IEEE Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems
Konferenzort
Amsterdam, The Netherlands
Konferenzdatum
2014-10-01 – 2014-10-03
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Sorrenti D, Cozzi D, Korf S, et al. Exploiting Dynamic Partial Reconfiguration for On-Line On-Demand Testing of Permanent Faults in Reconfigurable Systems. Presented at the 17th IEEE Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Amsterdam, The Netherlands.
Sorrenti, D., Cozzi, D., Korf, S., Cassano, L., Hagemeyer, J., Porrmann, M., & Bernadeschi, C. (2014). Exploiting Dynamic Partial Reconfiguration for On-Line On-Demand Testing of Permanent Faults in Reconfigurable Systems. Presented at the 17th IEEE Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Amsterdam, The Netherlands. doi:10.1109/DFT.2014.6962065
Sorrenti, D., Cozzi, D., Korf, S., Cassano, L., Hagemeyer, J., Porrmann, M., and Bernadeschi, C. (2014).“Exploiting Dynamic Partial Reconfiguration for On-Line On-Demand Testing of Permanent Faults in Reconfigurable Systems”. Presented at the 17th IEEE Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Amsterdam, The Netherlands.
Sorrenti, D., et al., 2014. Exploiting Dynamic Partial Reconfiguration for On-Line On-Demand Testing of Permanent Faults in Reconfigurable Systems. Presented at the 17th IEEE Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Amsterdam, The Netherlands.
D. Sorrenti, et al., “Exploiting Dynamic Partial Reconfiguration for On-Line On-Demand Testing of Permanent Faults in Reconfigurable Systems”, Presented at the 17th IEEE Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Amsterdam, The Netherlands, 2014.
Sorrenti, D., Cozzi, D., Korf, S., Cassano, L., Hagemeyer, J., Porrmann, M., Bernadeschi, C.: Exploiting Dynamic Partial Reconfiguration for On-Line On-Demand Testing of Permanent Faults in Reconfigurable Systems. Presented at the 17th IEEE Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Amsterdam, The Netherlands (2014).
Sorrenti, Domenico, Cozzi, Dario, Korf, Sebastian, Cassano, Luca, Hagemeyer, Jens, Porrmann, Mario, and Bernadeschi, Cinzia. “Exploiting Dynamic Partial Reconfiguration for On-Line On-Demand Testing of Permanent Faults in Reconfigurable Systems”. Presented at the 17th IEEE Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Amsterdam, The Netherlands, 2014.
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