The Factorial Survey as a Method for Measuring Sensitive Issues

Auspurg K, Hinz T, Liebig S, Sauer C (2015)
In: Improving Survey Methods. Lessons from recent Research. Engel U, Jann B, Lynn P, Scherpenzeel A, Sturgis P (Eds);New York: Routledge: 137-149.

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Engel, Uwe ; Jann, Ben ; Lynn, Peter ; Scherpenzeel, Anette ; Sturgis, Patrick
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Auspurg K, Hinz T, Liebig S, Sauer C. The Factorial Survey as a Method for Measuring Sensitive Issues. In: Engel U, Jann B, Lynn P, Scherpenzeel A, Sturgis P, eds. Improving Survey Methods. Lessons from recent Research. New York: Routledge; 2015: 137-149.
Auspurg, K., Hinz, T., Liebig, S., & Sauer, C. (2015). The Factorial Survey as a Method for Measuring Sensitive Issues. In U. Engel, B. Jann, P. Lynn, A. Scherpenzeel, & P. Sturgis (Eds.), Improving Survey Methods. Lessons from recent Research (pp. 137-149). New York: Routledge.
Auspurg, K., Hinz, T., Liebig, S., and Sauer, C. (2015). “The Factorial Survey as a Method for Measuring Sensitive Issues” in Improving Survey Methods. Lessons from recent Research, ed. U. Engel, B. Jann, P. Lynn, A. Scherpenzeel, and P. Sturgis (New York: Routledge), 137-149.
Auspurg, K., et al., 2015. The Factorial Survey as a Method for Measuring Sensitive Issues. In U. Engel, et al., eds. Improving Survey Methods. Lessons from recent Research. New York: Routledge, pp. 137-149.
K. Auspurg, et al., “The Factorial Survey as a Method for Measuring Sensitive Issues”, Improving Survey Methods. Lessons from recent Research, U. Engel, et al., eds., New York: Routledge, 2015, pp.137-149.
Auspurg, K., Hinz, T., Liebig, S., Sauer, C.: The Factorial Survey as a Method for Measuring Sensitive Issues. In: Engel, U., Jann, B., Lynn, P., Scherpenzeel, A., and Sturgis, P. (eds.) Improving Survey Methods. Lessons from recent Research. p. 137-149. Routledge, New York (2015).
Auspurg, Katrin, Hinz, Thomas, Liebig, Stefan, and Sauer, Carsten. “The Factorial Survey as a Method for Measuring Sensitive Issues”. Improving Survey Methods. Lessons from recent Research. Ed. Uwe Engel, Ben Jann, Peter Lynn, Anette Scherpenzeel, and Patrick Sturgis. New York: Routledge, 2015. 137-149.
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