Kernel Particle Filter for Visual Quality Inspection from Monocular Intensity Images

Stößel D, Sagerer G (2006)
In: Pattern Recognition. 28th DAGM Symposium, Berlin, Germany, September 12-14, 2006. Proceedings. Franke K, Müller K-R, Nickolay B, Schäfer R (Eds); Lecture Notes in Computer Science, 4174. Heidelberg, Germany: Springer-Verlag: 597-606.

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Konferenzbeitrag | Veröffentlicht | Englisch
Autor
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Abstract / Bemerkung
Industrial part assembly has come a long way and so has visual quality inspection. Nevertheless, the key issue in automated industrial quality inspection, i.e. the pose recovery of the objects under inspection, is still a challenging task for assemblies with more than two rigid parts. This paper presents a system for the pose recovery of assemblies consisting of an arbitrary number of rigid subparts. In an offline stage, the system extracts edge information from CAD models. Online, the system uses a novel kernel particle filter to recover the full pose of the visible subparts of the assembly under inspection. The accuracy of the pose estimation is evaluated and compared to state-of-the-art systems.
Erscheinungsjahr
Titel des Konferenzbandes
Pattern Recognition. 28th DAGM Symposium, Berlin, Germany, September 12-14, 2006. Proceedings
Seite
597-606
Konferenz
28th DAGM Symposium
Konferenzort
Berlin, Germany
Konferenzdatum
2006-09-12 – 2006-09-14
PUB-ID

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Stößel D, Sagerer G. Kernel Particle Filter for Visual Quality Inspection from Monocular Intensity Images. In: Franke K, Müller K-R, Nickolay B, Schäfer R, eds. Pattern Recognition. 28th DAGM Symposium, Berlin, Germany, September 12-14, 2006. Proceedings. Lecture Notes in Computer Science, 4174. Heidelberg, Germany: Springer-Verlag; 2006: 597-606.
Stößel, D., & Sagerer, G. (2006). Kernel Particle Filter for Visual Quality Inspection from Monocular Intensity Images. In K. Franke, K. - R. Müller, B. Nickolay, & R. Schäfer (Eds.), Lecture Notes in Computer Science, 4174. Pattern Recognition. 28th DAGM Symposium, Berlin, Germany, September 12-14, 2006. Proceedings (pp. 597-606). Heidelberg, Germany: Springer-Verlag.
Stößel, D., and Sagerer, G. (2006). “Kernel Particle Filter for Visual Quality Inspection from Monocular Intensity Images” in Pattern Recognition. 28th DAGM Symposium, Berlin, Germany, September 12-14, 2006. Proceedings, Franke, K., Müller, K. - R., Nickolay, B., and Schäfer, R. eds. Lecture Notes in Computer Science, 4174 (Heidelberg, Germany: Springer-Verlag), 597-606.
Stößel, D., & Sagerer, G., 2006. Kernel Particle Filter for Visual Quality Inspection from Monocular Intensity Images. In K. Franke, et al., eds. Pattern Recognition. 28th DAGM Symposium, Berlin, Germany, September 12-14, 2006. Proceedings. Lecture Notes in Computer Science, 4174. Heidelberg, Germany: Springer-Verlag, pp. 597-606.
D. Stößel and G. Sagerer, “Kernel Particle Filter for Visual Quality Inspection from Monocular Intensity Images”, Pattern Recognition. 28th DAGM Symposium, Berlin, Germany, September 12-14, 2006. Proceedings, K. Franke, et al., eds., Lecture Notes in Computer Science, 4174, Heidelberg, Germany: Springer-Verlag, 2006, pp.597-606.
Stößel, D., Sagerer, G.: Kernel Particle Filter for Visual Quality Inspection from Monocular Intensity Images. In: Franke, K., Müller, K.-R., Nickolay, B., and Schäfer, R. (eds.) Pattern Recognition. 28th DAGM Symposium, Berlin, Germany, September 12-14, 2006. Proceedings. Lecture Notes in Computer Science, 4174. p. 597-606. Springer-Verlag, Heidelberg, Germany (2006).
Stößel, Dirk, and Sagerer, Gerhard. “Kernel Particle Filter for Visual Quality Inspection from Monocular Intensity Images”. Pattern Recognition. 28th DAGM Symposium, Berlin, Germany, September 12-14, 2006. Proceedings. Ed. Katrin Franke, Klaus-Robert Müller, Bertram Nickolay, and Ralf Schäfer. Heidelberg, Germany: Springer-Verlag, 2006. Lecture Notes in Computer Science, 4174. 597-606.