DEFORMATION-FREE TOPOGRAPHY FROM COMBINED SCANNING FORCE AND TUNNELING EXPERIMENTS

Anselmetti D, GERBER C, MICHEL B, WOLF H, GÜNTHERODT HJ, ROHRER H (1993)
EPL (Europhysics Letters) 23(6): 421-426.

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We show that by measuring force and stiffness on a constant-current scanning tunnelling microscopy (STM) contour a deformation-free topography can be extracted. With reference to mono- and bicomponent self-assembled monolayers, we find that the characteristic depression pattern and the protrusions on a multicomponent film found in STM are to a great extent due to electronic effects.
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Anselmetti D, GERBER C, MICHEL B, WOLF H, GÜNTHERODT HJ, ROHRER H. DEFORMATION-FREE TOPOGRAPHY FROM COMBINED SCANNING FORCE AND TUNNELING EXPERIMENTS. EPL (Europhysics Letters). 1993;23(6):421-426.
Anselmetti, D., GERBER, C., MICHEL, B., WOLF, H., GÜNTHERODT, H. J., & ROHRER, H. (1993). DEFORMATION-FREE TOPOGRAPHY FROM COMBINED SCANNING FORCE AND TUNNELING EXPERIMENTS. EPL (Europhysics Letters), 23(6), 421-426.
Anselmetti, D., GERBER, C., MICHEL, B., WOLF, H., GÜNTHERODT, H. J., and ROHRER, H. (1993). DEFORMATION-FREE TOPOGRAPHY FROM COMBINED SCANNING FORCE AND TUNNELING EXPERIMENTS. EPL (Europhysics Letters) 23, 421-426.
Anselmetti, D., et al., 1993. DEFORMATION-FREE TOPOGRAPHY FROM COMBINED SCANNING FORCE AND TUNNELING EXPERIMENTS. EPL (Europhysics Letters), 23(6), p 421-426.
D. Anselmetti, et al., “DEFORMATION-FREE TOPOGRAPHY FROM COMBINED SCANNING FORCE AND TUNNELING EXPERIMENTS”, EPL (Europhysics Letters), vol. 23, 1993, pp. 421-426.
Anselmetti, D., GERBER, C., MICHEL, B., WOLF, H., GÜNTHERODT, H.J., ROHRER, H.: DEFORMATION-FREE TOPOGRAPHY FROM COMBINED SCANNING FORCE AND TUNNELING EXPERIMENTS. EPL (Europhysics Letters). 23, 421-426 (1993).
Anselmetti, Dario, GERBER, C, MICHEL, B, WOLF, H, GÜNTHERODT, HJ, and ROHRER, H. “DEFORMATION-FREE TOPOGRAPHY FROM COMBINED SCANNING FORCE AND TUNNELING EXPERIMENTS”. EPL (Europhysics Letters) 23.6 (1993): 421-426.
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