Scanning Probe Microscopy for Industrial Applications: Selected Examples

DAMMER U, Anselmetti D, DREIER M, FROMMER J, FUNFSCHILLING J, GERTH G, GÜNTHERODT HJ, HAEFKE H, HIDBER HR, HOWALD L, HUG HJ, et al. (1993)
Scanning 15(5): 257-264.

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Zeitschriftenaufsatz | Veröffentlicht | Englisch
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Abstract / Bemerkung
Some examples are selected to demonstrate the variety of possible scanning probe microscopy application in industry. Magnetic and magnetooptical storage media can be investigated by magnetic force microscopy, whereas a conventional scanning force microscope is used to examine surface features of many different materials, such as technical glasses, photosensitive materials, new superconductors, and biomolecules. Some other examples include the modification as well as the observation of liquid crystal devices, and the impact that scanning probe microscopy has on other techniques such as high precision stepping motors and high quality electron beam sources.
Erscheinungsjahr
Zeitschriftentitel
Scanning
Band
15
Zeitschriftennummer
5
Seite
257-264
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PUB-ID

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DAMMER U, Anselmetti D, DREIER M, et al. Scanning Probe Microscopy for Industrial Applications: Selected Examples. Scanning. 1993;15(5):257-264.
DAMMER, U., Anselmetti, D., DREIER, M., FROMMER, J., FUNFSCHILLING, J., GERTH, G., GÜNTHERODT, H. J., et al. (1993). Scanning Probe Microscopy for Industrial Applications: Selected Examples. Scanning, 15(5), 257-264. doi:10.1002/sca.4950150504
DAMMER, U., Anselmetti, D., DREIER, M., FROMMER, J., FUNFSCHILLING, J., GERTH, G., GÜNTHERODT, H. J., HAEFKE, H., HIDBER, H. R., HOWALD, L., et al. (1993). Scanning Probe Microscopy for Industrial Applications: Selected Examples. Scanning 15, 257-264.
DAMMER, U., et al., 1993. Scanning Probe Microscopy for Industrial Applications: Selected Examples. Scanning, 15(5), p 257-264.
U. DAMMER, et al., “Scanning Probe Microscopy for Industrial Applications: Selected Examples”, Scanning, vol. 15, 1993, pp. 257-264.
DAMMER, U., Anselmetti, D., DREIER, M., FROMMER, J., FUNFSCHILLING, J., GERTH, G., GÜNTHERODT, H.J., HAEFKE, H., HIDBER, H.R., HOWALD, L., HUG, H.J., JUNG, T.H., LANG, H.P., LÜTHI, R., MEYER, E., MOSER, A., PARASHIKOV, I., REIMANN, P., RICHMOND, T., RUETSCHI, M., RUDIN, H., SCHWARZ, U.D., STAUFER, U., SUM, R.: Scanning Probe Microscopy for Industrial Applications: Selected Examples. Scanning. 15, 257-264 (1993).
DAMMER, U, Anselmetti, Dario, DREIER, M, FROMMER, J, FUNFSCHILLING, J, GERTH, G, GÜNTHERODT, HJ, HAEFKE, H, HIDBER, HR, HOWALD, L, HUG, HJ, JUNG, TH, LANG, HP, LÜTHI, R, MEYER, E, MOSER, A, PARASHIKOV, I, REIMANN, P, RICHMOND, T, RUETSCHI, M, RUDIN, H, SCHWARZ, UD, STAUFER, U, and SUM, R. “Scanning Probe Microscopy for Industrial Applications: Selected Examples”. Scanning 15.5 (1993): 257-264.