FIELD-ION MICROSCOPY (FIM) AND ATOM PROBE (AP) INVESTIGATIONS OF FENDB AND RELATED PERMANENT-MAGNETS

Hütten A, HAASEN P (1987)
Journal of Applied Physics 61(8): 3769-3771.

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Hütten A, HAASEN P. FIELD-ION MICROSCOPY (FIM) AND ATOM PROBE (AP) INVESTIGATIONS OF FENDB AND RELATED PERMANENT-MAGNETS. Journal of Applied Physics. 1987;61(8):3769-3771.
Hütten, A., & HAASEN, P. (1987). FIELD-ION MICROSCOPY (FIM) AND ATOM PROBE (AP) INVESTIGATIONS OF FENDB AND RELATED PERMANENT-MAGNETS. Journal of Applied Physics, 61(8), 3769-3771.
Hütten, A., and HAASEN, P. (1987). FIELD-ION MICROSCOPY (FIM) AND ATOM PROBE (AP) INVESTIGATIONS OF FENDB AND RELATED PERMANENT-MAGNETS. Journal of Applied Physics 61, 3769-3771.
Hütten, A., & HAASEN, P., 1987. FIELD-ION MICROSCOPY (FIM) AND ATOM PROBE (AP) INVESTIGATIONS OF FENDB AND RELATED PERMANENT-MAGNETS. Journal of Applied Physics, 61(8), p 3769-3771.
A. Hütten and P. HAASEN, “FIELD-ION MICROSCOPY (FIM) AND ATOM PROBE (AP) INVESTIGATIONS OF FENDB AND RELATED PERMANENT-MAGNETS”, Journal of Applied Physics, vol. 61, 1987, pp. 3769-3771.
Hütten, A., HAASEN, P.: FIELD-ION MICROSCOPY (FIM) AND ATOM PROBE (AP) INVESTIGATIONS OF FENDB AND RELATED PERMANENT-MAGNETS. Journal of Applied Physics. 61, 3769-3771 (1987).
Hütten, Andreas, and HAASEN, P. “FIELD-ION MICROSCOPY (FIM) AND ATOM PROBE (AP) INVESTIGATIONS OF FENDB AND RELATED PERMANENT-MAGNETS”. Journal of Applied Physics 61.8 (1987): 3769-3771.
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