Ambipolar characteristics of microcrystalline silicon thin-film transistors

Chan KY, Gordijn A, Stiebig H, Knipp D (2010)
Physica Status Solidi (c) 7(3-4): 1144-1147.

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Chan KY, Gordijn A, Stiebig H, Knipp D. Ambipolar characteristics of microcrystalline silicon thin-film transistors. Physica Status Solidi (c). 2010;7(3-4):1144-1147.
Chan, K. Y., Gordijn, A., Stiebig, H., & Knipp, D. (2010). Ambipolar characteristics of microcrystalline silicon thin-film transistors. Physica Status Solidi (c), 7(3-4), 1144-1147. doi:10.10002/pssc.200982816
Chan, K. Y., Gordijn, A., Stiebig, H., and Knipp, D. (2010). Ambipolar characteristics of microcrystalline silicon thin-film transistors. Physica Status Solidi (c) 7, 1144-1147.
Chan, K.Y., et al., 2010. Ambipolar characteristics of microcrystalline silicon thin-film transistors. Physica Status Solidi (c), 7(3-4), p 1144-1147.
K.Y. Chan, et al., “Ambipolar characteristics of microcrystalline silicon thin-film transistors”, Physica Status Solidi (c), vol. 7, 2010, pp. 1144-1147.
Chan, K.Y., Gordijn, A., Stiebig, H., Knipp, D.: Ambipolar characteristics of microcrystalline silicon thin-film transistors. Physica Status Solidi (c). 7, 1144-1147 (2010).
Chan, K.Y., Gordijn, A., Stiebig, Helmut, and Knipp, D. “Ambipolar characteristics of microcrystalline silicon thin-film transistors”. Physica Status Solidi (c) 7.3-4 (2010): 1144-1147.
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