Noice Characterization of a-Si:H pin diodes

Jankovec M, Stiebig H, Smole F, Topic M (2006)
J. Non-cryst. Solids 352(9-20): 1829-1831.

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Jankovec M, Stiebig H, Smole F, Topic M. Noice Characterization of a-Si:H pin diodes. J. Non-cryst. Solids. 2006;352(9-20):1829-1831.
Jankovec, M., Stiebig, H., Smole, F., & Topic, M. (2006). Noice Characterization of a-Si:H pin diodes. J. Non-cryst. Solids, 352(9-20), 1829-1831.
Jankovec, M., Stiebig, H., Smole, F., and Topic, M. (2006). Noice Characterization of a-Si:H pin diodes. J. Non-cryst. Solids 352, 1829-1831.
Jankovec, M., et al., 2006. Noice Characterization of a-Si:H pin diodes. J. Non-cryst. Solids, 352(9-20), p 1829-1831.
M. Jankovec, et al., “Noice Characterization of a-Si:H pin diodes”, J. Non-cryst. Solids, vol. 352, 2006, pp. 1829-1831.
Jankovec, M., Stiebig, H., Smole, F., Topic, M.: Noice Characterization of a-Si:H pin diodes. J. Non-cryst. Solids. 352, 1829-1831 (2006).
Jankovec, M., Stiebig, Helmut, Smole, F., and Topic, M. “Noice Characterization of a-Si:H pin diodes”. J. Non-cryst. Solids 352.9-20 (2006): 1829-1831.
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