Structural Study of Amorphous CoFeB Magnetic Thin Films by Electron Diffraction

Kohn A, Kirk D, Borisenko KB, Lang C, Schmalhorst J-M, Reiss G, Cockayne DJH (2010)
Microscopy and Microanalysis 16(52): 1806-1807.

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Konferenzbeitrag | Veröffentlicht | Englisch
Autor
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Erscheinungsjahr
Band
16
Zeitschriftennummer
52
Seite
1806-1807
Konferenz
Microscopy and Microanalysis 2010
Konferenzort
Portland, Oregon, USA
Konferenzdatum
2010-08-01 – 2010-08-05
ISSN
PUB-ID

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Kohn A, Kirk D, Borisenko KB, et al. Structural Study of Amorphous CoFeB Magnetic Thin Films by Electron Diffraction. Microscopy and Microanalysis. 2010;16(52):1806-1807.
Kohn, A., Kirk, D., Borisenko, K. B., Lang, C., Schmalhorst, J. - M., Reiss, G., & Cockayne, D. J. H. (2010). Structural Study of Amorphous CoFeB Magnetic Thin Films by Electron Diffraction. Microscopy and Microanalysis, 16(52), 1806-1807. doi:10.1017/S1431927610056163
Kohn, A., Kirk, D., Borisenko, K. B., Lang, C., Schmalhorst, J. - M., Reiss, G., and Cockayne, D. J. H. (2010). Structural Study of Amorphous CoFeB Magnetic Thin Films by Electron Diffraction. Microscopy and Microanalysis 16, 1806-1807.
Kohn, A., et al., 2010. Structural Study of Amorphous CoFeB Magnetic Thin Films by Electron Diffraction. Microscopy and Microanalysis, 16(52), p 1806-1807.
A. Kohn, et al., “Structural Study of Amorphous CoFeB Magnetic Thin Films by Electron Diffraction”, Microscopy and Microanalysis, vol. 16, 2010, pp. 1806-1807.
Kohn, A., Kirk, D., Borisenko, K.B., Lang, C., Schmalhorst, J.-M., Reiss, G., Cockayne, D.J.H.: Structural Study of Amorphous CoFeB Magnetic Thin Films by Electron Diffraction. Microscopy and Microanalysis. 16, 1806-1807 (2010).
Kohn, A., Kirk, D., Borisenko, K. B., Lang, C., Schmalhorst, Jan-Michael, Reiss, Günter, and Cockayne, D. J. H. “Structural Study of Amorphous CoFeB Magnetic Thin Films by Electron Diffraction”. Microscopy and Microanalysis 16.52 (2010): 1806-1807.

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