Ferroelectric domain characterisation and manipulation: a challenge for scanning probe microscopy

Eng LM, Bammerlin M, Loppacher C, Guggisberg M, Bennewitz R, Luthi R, Meyer E, Huser T, Heinzelmann H, Güntherodt HJ (1999)
Ferroelectrics 222(1): 153-162.

Journal Article | Published | English

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Abstract
Domain writing and reading on the nanometer scale is addressed with scanning force microscopy (SFM) Compared to other scanning probe methods, SFM provides broad possibilities for the on-line data controlling. i.e. three-dimensional mapping of polarisation distribution, differentiation between polarisation and topography, nanoscale domain switching of domains with a 60 nm diameter, recording of nanoscale hysteresis loops, phase transition mapping. domain wall imaging with 9 nm resolution, atomic resolution of ferroelectric surfaces, etc. All these issues are reported in this paper. The challenging result of such a concerted investigation is the possibility of using SFM for nanoscale domain writing and reading with nanometer resolution. Fig. 1 illustrates such an example where line shaped c - domains are purposely written into a ferroelectric Barium-Titanate single crystal with a 400 nm line-width. With this figure we highly appreciate and honour the work of Bob Newnham passing our best nano-wishes for his future.
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Eng LM, Bammerlin M, Loppacher C, et al. Ferroelectric domain characterisation and manipulation: a challenge for scanning probe microscopy. Ferroelectrics. 1999;222(1):153-162.
Eng, L. M., Bammerlin, M., Loppacher, C., Guggisberg, M., Bennewitz, R., Luthi, R., Meyer, E., et al. (1999). Ferroelectric domain characterisation and manipulation: a challenge for scanning probe microscopy. Ferroelectrics, 222(1), 153-162.
Eng, L. M., Bammerlin, M., Loppacher, C., Guggisberg, M., Bennewitz, R., Luthi, R., Meyer, E., Huser, T., Heinzelmann, H., and Güntherodt, H. J. (1999). Ferroelectric domain characterisation and manipulation: a challenge for scanning probe microscopy. Ferroelectrics 222, 153-162.
Eng, L.M., et al., 1999. Ferroelectric domain characterisation and manipulation: a challenge for scanning probe microscopy. Ferroelectrics, 222(1), p 153-162.
L.M. Eng, et al., “Ferroelectric domain characterisation and manipulation: a challenge for scanning probe microscopy”, Ferroelectrics, vol. 222, 1999, pp. 153-162.
Eng, L.M., Bammerlin, M., Loppacher, C., Guggisberg, M., Bennewitz, R., Luthi, R., Meyer, E., Huser, T., Heinzelmann, H., Güntherodt, H.J.: Ferroelectric domain characterisation and manipulation: a challenge for scanning probe microscopy. Ferroelectrics. 222, 153-162 (1999).
Eng, L.M., Bammerlin, M., Loppacher, C., Guggisberg, M., Bennewitz, R., Luthi, R, Meyer, E., Huser, Thomas, Heinzelmann, H., and Güntherodt, H. J. “Ferroelectric domain characterisation and manipulation: a challenge for scanning probe microscopy”. Ferroelectrics 222.1 (1999): 153-162.
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