Towards better scanning near-field optical microscopy probes - progress and new developments

Heinzelmann H, Freyland JM, Eckert R, Huser T, Schurmann G, Noell W, Staufer U, De Rooij NF (1999)
Journal of Microscopy 194: 365-368.

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Several approaches are described with the aim of producing near-field optical probes with improved properties. Focused ion beam milling allows the fabrication of small apertures in a controlled fashion, resulting in probes with excellent polarization properties and increased transmission. Microfabrication processes are described that allow the production of apertures of 30-50 nm, facilitating the mass-fabrication of apertured tip structures that can be used in a combined force/near-field optical microscope. Finally, possible future developments are outlined.
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Heinzelmann H, Freyland JM, Eckert R, et al. Towards better scanning near-field optical microscopy probes - progress and new developments. Journal of Microscopy. 1999;194:365-368.
Heinzelmann, H., Freyland, J. M., Eckert, R., Huser, T., Schurmann, G., Noell, W., Staufer, U., et al. (1999). Towards better scanning near-field optical microscopy probes - progress and new developments. Journal of Microscopy, 194, 365-368.
Heinzelmann, H., Freyland, J. M., Eckert, R., Huser, T., Schurmann, G., Noell, W., Staufer, U., and De Rooij, N. F. (1999). Towards better scanning near-field optical microscopy probes - progress and new developments. Journal of Microscopy 194, 365-368.
Heinzelmann, H., et al., 1999. Towards better scanning near-field optical microscopy probes - progress and new developments. Journal of Microscopy, 194, p 365-368.
H. Heinzelmann, et al., “Towards better scanning near-field optical microscopy probes - progress and new developments”, Journal of Microscopy, vol. 194, 1999, pp. 365-368.
Heinzelmann, H., Freyland, J.M., Eckert, R., Huser, T., Schurmann, G., Noell, W., Staufer, U., De Rooij, N.F.: Towards better scanning near-field optical microscopy probes - progress and new developments. Journal of Microscopy. 194, 365-368 (1999).
Heinzelmann, H., Freyland, J. M., Eckert, R., Huser, Thomas, Schurmann, G., Noell, W., Staufer, U., and De Rooij, N. F. “Towards better scanning near-field optical microscopy probes - progress and new developments”. Journal of Microscopy 194 (1999): 365-368.
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