Characterization of proton exchange layer profiles in KD2PO4 crystals by micro-Raman spectroscopy

Huser T, Hollars CW, Siekhaus WJ, De Yoreo J .J, Suratwala TI, Land TA (2004)
Applied Spectroscopy 58(3): 349-351.

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Zeitschriftenaufsatz | Veröffentlicht | Englisch
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Zeitschriftentitel
Applied Spectroscopy
Band
58
Zeitschriftennummer
3
Seite
349-351
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Huser T, Hollars CW, Siekhaus WJ, De Yoreo J .J, Suratwala TI, Land TA. Characterization of proton exchange layer profiles in KD2PO4 crystals by micro-Raman spectroscopy. Applied Spectroscopy. 2004;58(3):349-351.
Huser, T., Hollars, C. W., Siekhaus, W. J., De Yoreo, J. .J., Suratwala, T. I., & Land, T. A. (2004). Characterization of proton exchange layer profiles in KD2PO4 crystals by micro-Raman spectroscopy. Applied Spectroscopy, 58(3), 349-351. doi:10.1366/000370204322886726
Huser, T., Hollars, C. W., Siekhaus, W. J., De Yoreo, J. .J., Suratwala, T. I., and Land, T. A. (2004). Characterization of proton exchange layer profiles in KD2PO4 crystals by micro-Raman spectroscopy. Applied Spectroscopy 58, 349-351.
Huser, T., et al., 2004. Characterization of proton exchange layer profiles in KD2PO4 crystals by micro-Raman spectroscopy. Applied Spectroscopy, 58(3), p 349-351.
T. Huser, et al., “Characterization of proton exchange layer profiles in KD2PO4 crystals by micro-Raman spectroscopy”, Applied Spectroscopy, vol. 58, 2004, pp. 349-351.
Huser, T., Hollars, C.W., Siekhaus, W.J., De Yoreo, J. .J., Suratwala, T.I., Land, T.A.: Characterization of proton exchange layer profiles in KD2PO4 crystals by micro-Raman spectroscopy. Applied Spectroscopy. 58, 349-351 (2004).
Huser, Thomas, Hollars, C. W., Siekhaus, W. J., De Yoreo, J. .J, Suratwala, T. I., and Land, T. A. “Characterization of proton exchange layer profiles in KD2PO4 crystals by micro-Raman spectroscopy”. Applied Spectroscopy 58.3 (2004): 349-351.

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