Microscopic characterization of heavy-ion implanted diamond

Burchard A, Restle M, Deicher M, Hofsäss H, Hahn SG, König T, Magerle R, Pfeiffer W, Wahl U (1993)
Physica B 185(1-4): 150-153.

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Burchard A, Restle M, Deicher M, et al. Microscopic characterization of heavy-ion implanted diamond. Physica B. 1993;185(1-4):150-153.
Burchard, A., Restle, M., Deicher, M., Hofsäss, H., Hahn, S. G., König, T., Magerle, R., et al. (1993). Microscopic characterization of heavy-ion implanted diamond. Physica B, 185(1-4), 150-153.
Burchard, A., Restle, M., Deicher, M., Hofsäss, H., Hahn, S. G., König, T., Magerle, R., Pfeiffer, W., and Wahl, U. (1993). Microscopic characterization of heavy-ion implanted diamond. Physica B 185, 150-153.
Burchard, A., et al., 1993. Microscopic characterization of heavy-ion implanted diamond. Physica B, 185(1-4), p 150-153.
A. Burchard, et al., “Microscopic characterization of heavy-ion implanted diamond”, Physica B, vol. 185, 1993, pp. 150-153.
Burchard, A., Restle, M., Deicher, M., Hofsäss, H., Hahn, S.G., König, T., Magerle, R., Pfeiffer, W., Wahl, U.: Microscopic characterization of heavy-ion implanted diamond. Physica B. 185, 150-153 (1993).
Burchard, A., Restle, M., Deicher, M., Hofsäss, H., Hahn, S.G., König, Th., Magerle, R., Pfeiffer, Walter, and Wahl, U. “Microscopic characterization of heavy-ion implanted diamond”. Physica B 185.1-4 (1993): 150-153.
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